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Conference Proceedings
Conference Proceedings
1. MEASURING THE STRENGTH AND STIFFNESS OF THIN FILM MATERIAL BY MECHANICALLY DEFLECTING CANTILEVER MICROBEAMS
Weihs, T.P. ; Hong, S. ; Bravman, J.C. ; Nix, W.D.
Pub. info.: Thin films : stresses and mechanical properties : symposium held November 28-30, 1988, Boston, Massachusetts, U.S.A..  pp.87-92,  1989.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 130
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Conference Proceedings
Conference Proceedings
2. THE DETERMINATION OF MECHANICAL PARAMETERS AND RESIDUAL SRESSES FOR THIN FILMS USING MICRO-CANTILEVER BEAMS
Hong, S. ; Weihs, T.P. ; Bravman, J.C. ; Nix, W.D.
Pub. info.: Thin films : stresses and mechanical properties : symposium held November 28-30, 1988, Boston, Massachusetts, U.S.A..  pp.93-98,  1989.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 130
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Conference Proceedings
Conference Proceedings
3. Nonlocal transport and thermal noise of the nanoscale MOSFET
Jin, S. ; Hong, S. ; Kim, J. ; Park, Y. J. ; Min, H. S.
Pub. info.: Noise in devices and circuits II : 26-28 May 2004, Maspalomas, Gran Canaria, Spain.  pp.74-83,  2004.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5470
4.

Conference Proceedings
Conference Proceedings
4. Attainment of Low Resistivity Polycide Films Using Rapid Thermal Annealing
Yoon, H.A. ; Chen, C. ; Singhal, A. ; Lapes, D. ; Miner, G. ; Hong, S. ; Yamazaki, M. ; Maeda, Y.
Pub. info.: Advances in rapid thermal processing : proceedings of the symposium.  pp.249-256,  1999.  Pennington, N. J..  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 99-10
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Conference Proceedings
Conference Proceedings
5. A controlled outdoor test site for evaluation of soil effects on landmine detection sensors
van Dam, R.L. ; Hendrickx, J.M. ; Borchers, B. ; Hong, S. ; Miller, T.W. ; Harmon, R.S.
Pub. info.: Detection and remediation technologies for mines and minelike targets IX : 12-16 April 2004, Orlando, Florida, USA.  pp.1335-1344,  2004.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5415
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Conference Proceedings
Conference Proceedings
6. Subjective adaptive correction of the aberrations of the human eye
Vdovin, G. ; Loktev, M. ; Simonov, A. ; Hong, S. ; Kiyko, V. ; Volkov, S.
Pub. info.: Opto-Ireland 2005: Imaging and Vision.  pp.154-163,  2005.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5823
7.

Conference Proceedings
Conference Proceedings
7. Process-structure-property interrelationships of copper for electronic applications
Woodman, A.S. ; Taylor, E.J. ; Anderson, E.B. ; Weil, R. ; Hong, S. ; Knapke, D.H. ; Fisher, G.L.
Pub. info.: Proceedings of the Second International Symposium on Electrochemical Technology Applications in Electronics.  pp.86-98,  1993.  Pennington, NJ.  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 1993-20
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Conference Proceedings
Conference Proceedings
8. Acid diffusion characteristics of RELACS coating for 193-nm lithography
Hong, S. ; Nishibe, T. ; Okayasu, T. ; Takahashi, K. ; Takano, Y. ; Kang, W. ; Tanaka, H.
Pub. info.: Advances in resist technology and processing XXI.  pp.285-293,  2004.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5376
9.

Conference Proceedings
Conference Proceedings
9. Time-resolved photoluminescence of the ZnO nanorods: size and temperature dependences
Hong, S. ; Joo, T. ; Park, W.I. ; Yi, G.-C.
Pub. info.: Ultrafast Phenomena in Semiconductors and Nanostructure Materials VIII.  pp.53-64,  2004.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5352
10.

Conference Proceedings
Conference Proceedings
10. Quantum-structure dependent excitonic carrier dynamics of InxGal-xN/GaN multi-quantum-wells (Invited Paper) [6121-04]
Hong, S. ; Kim, Y. S. ; Yoon, Y.J. ; Park, J.S. ; Kim, B. K. ; Fomin, A. ; Lee, G. H. ; Kim, J.W. ; Cho, H.K. ; Joo, T.
Pub. info.: Gallium Nitride Materials and Devices.  pp.612105-,  2006.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 6121