1.

Conference Proceedings
Conference Proceedings
1. X-RAY DIFFRACTION AND REFLECTANCE, RAMAN SCATTERING AND PHOTOLUMINESCENCE CHARACTERIZATION OF THERMALLY ANNEALED EPITAXIAL Si1-XGeX LAYERS
Libezny, M. ; De WoIf, I. ; Poortmans, J. ; Van Ammel, A. ; Caymax, M. ; Holy, V. ; Vi-da, F. ; Kub-na, J. ; Werner, K. ; Ishida, M.
Pub. info.: Silicon-based optoelectronic materials : Symposium held April 12-14, 1993, San Francisco, California, U.S.A..  pp.51-56,  1993.  Pittsburgh, PA.  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 298
2.

Conference Proceedings
Conference Proceedings
2. *Lateral and vertical ordering of PbSe self-assembled quantum dots in PbSe/PbEuTe superlattices
Holy, V. ; Stangl, J. ; Springholz, G. ; Pinczolits, M. ; Bauer, G.
Pub. info.: Morphological and compositional evolution of heteroepitaxial semiconductor thin films : symposium held April 24-27, 2000, San Francisco, California.  pp.161-,  2000.  Warrendale, Pennsylvania..  MRS-Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 618
3.

Conference Proceedings
Conference Proceedings
3. TEM investigation of self-organized PbSe quantum dots as a function of spacer layer thickness and growth temperature
Kang, H. H. ; Salamanca-Riba, L. ; Pinczolits, M. ; Springholz, G. ; Holy, V. ; Bauer, G.
Pub. info.: Self-organized processes in semiconductor alloys : symposium held November 29-December 2, 1999 Boston, Massachusetts, U.S.A..  pp.87-,  2000.  Warrendale, Pa..  MRS-Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 583
4.

Conference Proceedings
Conference Proceedings
4. Structural Characterization of Reactive Ion Etched Semiconductor Nonostructures Using X-ray Reciprocal Space Mapping
Bauer, G. ; Darhuber, A. A. ; Holy, V.
Pub. info.: Diagnostic techniques for semiconductor materials processing II : symposium held November 27-30, 1995, Boston, Massachusetts, U.S.A..  pp.457-,  1996.  Pittsburgh, Pa..  MRS - Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 406
5.

Conference Proceedings
Conference Proceedings
5. X-Ray Scattering Methods for the Study of Epitaxial Self-Assembled Quantum Dots
Stangl, J. ; Schulli, T. ; Hesse, A. ; Bauer, G. ; Holy, V.
Pub. info.: Quantum dots : fundamentals, applications, and frontiers.  pp.183-208,  2005.  Dordrecht.  Springer
Title of ser.: NATO science series. Series 2, Mathematics, physics and chemistry
Ser. no.: 190
6.

Conference Proceedings
Conference Proceedings
6. Co/Si/W/Si Multilayers with Enhanced Thermal Stability for Soft X-Ray and UV Optics
Jergel, M. ; Anopchenko, A. ; Luby, S. ; Majkova, E. ; Senderak, R. ; Holy, V.
Pub. info.: EPDIC 7 : proceedings of the seventh European Powder Diffraction Conference, held May 20-23, 2000 in Barcelona, Spain.  pp.364-369,  2001.  Zuerich-Uetikon, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 378-381
7.

Conference Proceedings
Conference Proceedings
7. Effect of Ion-Beam Polishing on the Interface Quality in a Ti/C Multilayer Mirror for 'Water Window'
Jergel, M. ; Holy, V. ; Majkova, E. ; Luby, S. ; Senderak, R. ; Stock, H. J. ; Menke, D. ; Kleineberg, U. ; Heinzmann, U.
Pub. info.: EPDIC 6 : proceedings of the sixth European Powder Diffraction Conference, held August 22-25, 1998 in Budapest, Hungary.  pp.184-191,  2000.  Zuerich-Uetikon, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 321-324(1)
8.

Conference Proceedings
Conference Proceedings
8. X-ray Characterization of Nanostructured Semiconductor Short-Period Superlattices
Li, Jianhua ; Moss, S.C. ; Holy, V. ; Norman, A.G. ; Mascarenhas, A. ; Reno, J.L.
Pub. info.: Morphological and compositional evolution of thin films : symposium held December 2-5, 2002, Boston, Massachusetts, U.S.A..  pp.389-394,  2003.  Warrendale, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 749
9.

Conference Proceedings
Conference Proceedings
9. Structural Characterization of Reactive Ion Etched Semiconductor Nanostructures Using X-ray Reciprocal Space Mapping
Bauer, G. ; Darhuber, A. A. ; Holy, V.
Pub. info.: Surface/interface and stress effects in electronic material nanostructures : symposium held November 27-December 1, 1995, Boston, Massachusetts, U.S.A..  pp.359-,  1996.  Pittsburgh, Pa..  MRS - Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 405