1.

Conference Proceedings

Conference Proceedings
Meyer, B.K. ; Hofmann, D.M. ; Stadler, W. ; Emanuelsson, P. ; Omling, P. ; Weigel, E. ; Muller-Vogt, G. ; Wienecke, F. ; Schenk, M.
Pub. info.: Infrared detectors : materials, processing, and devices : symposium held April 14-16, 1993, San Francisco, California, U.S.A..  pp.185-190,  1994.  Pittsburgh, PA.  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 299
2.

Conference Proceedings

Conference Proceedings
Stadler, W. ; Meyer, B.K. ; Hofmann, D.M. ; Sinerius, D. ; Benz, K.W.
Pub. info.: Defects in materials : symposium held November 26-29, 1990, Boston, Massachusetts, U.S.A..  pp.445-450,  1991.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 209
3.

Conference Proceedings

Conference Proceedings
Meyer, B.K. ; Hofmann, D.M. ; Eckstein, J. ; Benz, K.W.
Pub. info.: Wide band gap semiconductors : symposium held December 2-6, 1991, Boston, Massachusetts, U.S.A..  pp.773-778,  1992.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 242