1.
|
Conference Proceedings
|
Aswendt, P. ; Hofling, R. ; Hiller, K.
Pub. info.: |
Microsystems Metrology and Inspection. pp.165-173, 1999. Bellingham, Wash.. SPIE - The International Society of Optical Engineering |
Title of ser.: |
Proceedings of SPIE - the International Society for Optical Engineering |
Ser. no.: |
3825 |
|
2.
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Conference Proceedings
|
Aswendt, P. ; Hofling, R. ; Gartner, S.
Pub. info.: |
Optical Measurement Systems for Industrial Inspection IV. pp.393-400, 2005. Bellingham, Wash.. SPIE - The International Society of Optical Engineering |
Title of ser.: |
Proceedings of SPIE - the International Society for Optical Engineering |
Ser. no.: |
5856 |
|
3.
|
Conference Proceedings
|
Hofling, R.
Pub. info.: |
Optical Metrology in Production Engineering. pp.50-55, 2004. Bellingham, Wash.. SPIE - The International Society of Optical Engineering |
Title of ser.: |
Proceedings of SPIE - the International Society for Optical Engineering |
Ser. no.: |
5457 |
|
4.
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Conference Proceedings
|
Holstein, D. ; Aswendt, P. ; Hofling, R. ; Schmidt, C.D. ; Juptner, W.
Pub. info.: |
International Conference on Applied Optical Metrology. pp.429-436, 1998. Bellingham, Wash.. SPIE--International Society for Optical Engineering |
Title of ser.: |
Proceedings of SPIE - the International Society for Optical Engineering |
Ser. no.: |
3407 |
|