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Conference Proceedings

1. Growth and Metrology of Silicon Oxides on Silicon Carbide

Hoff, Andrew M.

Pub. info.:	Silicon carbide 2004--materials, processing and devices : symposium held April 14-15, 2004, San Francisco, California, U.S.A.. pp.189-198, 2004. Warrendale, Pa.. Materials Research Society
Title of ser.:	Materials Research Society symposium proceedings
Ser. no.:	815

Conference Proceedings

2. Effect Of Metallic Contamination On Interface Properties And Oxide Reliability

Oborina, Elena ; Campbell, Scott ; Hoff, Andrew M. ; Gilbert, Richard ; Persson, Eric ; Simpson, Darrell

Pub. info.:	Silicon materials - processing characterization and reliability : symposium held April 1-5, 2002, San Francisco, California, U.S.A.. pp.651-656, 2002. Warrendale. Materials Research Society
Title of ser.:	Materials Research Society symposium proceedings
Ser. no.:	716

Conference Proceedings

3. Afterglow Thermal Oxidation of Silicon Carbide

Hoff, Andrew M. ; Tibrewala, Arti ; Saddow, Stephen E.

Pub. info.:	Silicon carbide 2002 -- materials, processing and devices : symposium held December 2-4, 2002, Boston, Massachusetts, U.S.A.. pp.227-232, 2003. Warrendale, Pa.. Materials Research Society
Title of ser.:	Materials Research Society symposium proceedings
Ser. no.:	742