Search records | 東京工業大学附属図書館文献データベース

You can search for articles included in proceedings of international conferences and technical papers which Tokyo Tech Library holds.
Tokyo Tech members can obtain tables of contents of 17,000 foreign journals by SwetScan. Tokyo Tech Library does not cover all of them.
List of Searchable Databases

Clear Form

Search for other sites by same keyword(s).

CiNii Books

NDL Search

WebcatPlus

amazon

カーリル

WorldCat

Filter

Title:

Author:

ISBN / ISSN / Paper No:

Source Title:

Publisher:

Publication Year:

～

Clear Form

Type:

Conference Proceedings

Technical Paper

Academic Journal

Select: Check all | Remove all

Sort order

10 | 50 | 100 / Per Page

13 results

Conference Proceedings

1. Critical and Sub-Critical Debonding in Nano-Clustering Porous Low-k Films

Smith, R.S. ; Uchibori, C.J. ; Ho, P.S. ; Nakamura, T.

Pub. info.:	Materials, technology and reliability of low-k dielectrics and copper interconnects : symposium held April 18-21, 2006, San Francisco, California, U.S.A.. pp.83-88, 2006. Warrendale, Pa.. Materials Research Society
Title of ser.:	Materials Research Society symposium proceedings
Ser. no.:	914

Conference Proceedings

2. Thermal Stress Characteristics and Void Formation in Al(Cu) Interconnects

Ho, P.S. ; Yeo, I.-s. ; Jawarani, D. ; Anderson, S.G. ; Kawasaki, H.

Pub. info.:	Proceedings of the Symposium on Reliability of Metals in Electronics. pp.106-115, 1995. Pennington, NJ. Electrochemical Society
Title of ser.:	Electrochemical Society Proceedings Series
Ser. no.:	95-3

Conference Proceedings

3. Out-of-Plane Thermal and Mechanical Properties of Polyimide Thin Films

Liou, H.-C. ; Willecke, R. ; Ho, P.S.

Pub. info.:	Dielectric material integration for microelectronics. pp.272-278, 1998. Pennington, NJ. Electrochemical Society
Title of ser.:	Electrochemical Society Proceedings Series
Ser. no.:	98-3

Conference Proceedings

4. Stress Voiding and Electromigration Failure in Multilevel Interconnect Metallization

Ho, P.S. ; Anderson, S.G.H. ; Yeo, I.S. ; Hu, C.K.

Pub. info.:	Proceedings of the fourth International Symposium on Ultra Large Scale Integration Science and Technology : ULSI science and technology/1993. pp.220-237, 1993. Pennington, NJ. Electrochemical Society
Title of ser.:	Electrochemical Society Proceedings Series
Ser. no.:	1993-13

Conference Proceedings

5. The Thermal and Mechanical Properties of Perfluorocyclobutane Aromatic Ether Polymers

Liou, H.-C. ; Ho, P.S. ; McKerrow, A.

Pub. info.:	Dielectric material integration for microelectronics. pp.113-117, 1998. Pennington, NJ. Electrochemical Society
Title of ser.:	Electrochemical Society Proceedings Series
Ser. no.:	98-3

Conference Proceedings

6. EFFECTS OF HYDROGEN ON THERMAL STRESS IN LAYERED STRUCTURE OF Ti AND Ti (Al) THIN FILMS

Hu,C.-K. ; Ho, P.S. ; Gupta, D. ; Chen, S.T.

Pub. info.:	Thin films : stresses and mechanical properties : symposium held November 28-30, 1988, Boston, Massachusetts, U.S.A.. pp.255-260, 1989. Pittsburgh, Pa.. Materials Research Society
Title of ser.:	Materials Research Society symposium proceedings
Ser. no.:	130

Conference Proceedings

7. ALUMINA-Ti INTERFACE REACTIONS STUDIED BY AES AND UPS

Lefakis, H. ; Liehr, M. ; Rubloff, G.W. ; Ho, P.S.

Pub. info.:	Thin films : interfaces and phenomena : symposium held December 2-6, 1985, Boston, Massachusetts, USA. pp.133-138, 1985. Pittsburgh, Pa.. Materials Research Society
Title of ser.:	Materials Research Society symposium proceedings
Ser. no.:	54

Conference Proceedings

8. *SCHOTTKY BARRIER AND ELECTRONIC STATES AT SILICIDESILICON INTERFACES

Schmid, P.E. ; Liehr, M. ; LeGoues, F.K. ; Ho, P.S.

Pub. info.:	Thin films : interfaces and phenomena : symposium held December 2-6, 1985, Boston, Massachusetts, USA. pp.469-478, 1985. Pittsburgh, Pa.. Materials Research Society
Title of ser.:	Materials Research Society symposium proceedings
Ser. no.:	54

Conference Proceedings

9. *SILICIDE-SILICON INTERFACE STATES

Yang, E.S. ; Wu, X. ; Evans, H.L. ; Ho, P.S.

Pub. info.:	Thin films : interfaces and phenomena : symposium held December 2-6, 1985, Boston, Massachusetts, USA. pp.485-492, 1985. Pittsburgh, Pa.. Materials Research Society
Title of ser.:	Materials Research Society symposium proceedings
Ser. no.:	54

10.

Conference Proceedings

10. REACTION KINETICS, STRESS AND MICROSTRUCTURE IN TITANIUM-COPPER-TITANIUM THIN FILMS

Hu, C.-K. ; Gupta, D. ; Wetzel, J.T. ; Ho, P.S.

Pub. info.:	Thin films : interfaces and phenomena : symposium held December 2-6, 1985, Boston, Massachusetts, USA. pp.153-158, 1985. Pittsburgh, Pa.. Materials Research Society
Title of ser.:	Materials Research Society symposium proceedings
Ser. no.:	54

13 results

Select: Check all | Remove all

Sort order

10 | 50 | 100 / Per Page

Filtering by:

Author: Ho, P.S.