Characterization of complex space-time optical fields
- Author(s):
- Brady,D.J. ( Univ.of Illinois/Urbana-Champaign )
- Basinger,S.A.
- Stack,R.A.
- Hill,K.B.
- Guo,J.
- Publication title:
- Generation, Amplification, and Measurement of Ultrashort Laser Pulses III
- Title of ser.:
- Proceedings of SPIE - the International Society for Optical Engineering
- Ser. no.:
- 2701
- Pub. Year:
- 1996
- Page(from):
- 152
- Page(to):
- 158
- Pub. info.:
- Bellingham, Wash.: SPIE-The International Society for Optical Engineering
- ISSN:
- 0277786X
- ISBN:
- 9780819420756 [0819420751]
- Language:
- English
- Call no.:
- P63600/2701
- Type:
- Conference Proceedings
Similar Items:
1
Conference Proceedings
Average phase calculations with near-field diffraction algorithms for the Space Interferometry Mission
SPIE - The International Society for Optical Engineering |
Society of Photo-optical Instrumentation Engineers |
2
Conference Proceedings
Selection of the infrared detectors for Wide Field Camera 3 on the Hubble Space Telescope
SPIE - The International Society of Optical Engineering |
8
Conference Proceedings
Complex phase/amplitude spatial light modulator advances and use in a multispectral optical correlator
SPIE-The International Society for Optical Engineering |
3
Conference Proceedings
Extreme wave front sensing accuracy for the Eclipse coronagraphic space telescope
SPIE-The International Society for Optical Engineering |
SPIE-The International Society for Optical Engineering |
4
Conference Proceedings
STIS on-orbit testing: limiting magnitudes,spectral sensitivity,thermal flexure,and MAMA time tagging
SPIE-The International Society for Optical Engineering |
SPIE-The International Society for Optical Engineering |
SPIE-The International Society for Optical Engineering |
11
Conference Proceedings
Field demonstration andcharacterization of a10.6‐μm reflection tomography imaging system
SPIE-The International Society for Optical Engineering |
6
Conference Proceedings
Electrical characterization of across-field lithographic performance for 256-Mbit DRAM technologies
Society of Photo-optical Instrumentation Engineers |
SPIE-The International Society for Optical Engineering |