1.

Conference Proceedings
Conference Proceedings
1. ELECTRICAL, OPTICAL AND STRUCTURAL PROPERTIES OF THIN SiO2 FILMS ON Si
Ravindra, N. M. ; Russo, O. L. ; Fathy, D. ; Narayan, J. ; Heyd, A. R. ; Vedam, K.
Pub. info.: SiO[2] and its interfaces : symposium held November 30-December 5, 1987, Boston, Massachusetts, U.S.A..  pp.169-174,  1988.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 105
2.

Conference Proceedings
Conference Proceedings
2. CHARACTERIZATION OF HIGH Ge CONTENT SiGe HETEROSTRUCTURES AND GRADED ALLOY LAYERS USING SPECTROSCOPIC ELLIPSOMETRY
Heyd, A. R. ; Alterovitz, S. A. ; Croke, E. T.
Pub. info.: Microcrystalline and nanocrystalline semiconductors : Symposium held November 29-December 2, 1994, Boston, Massachusetts, U.S.A..  pp.993-,  1995.  Pittsburgh, Pa..  MRS - Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 358
3.

Conference Proceedings
Conference Proceedings
3. ELECTRICAL, OPTICAL AND STRUCTURAL PROPERTIES OF THIN Si02 FILMS ON Si
Ravindra, N. M. ; Russo, O. L. ; Fathy, D. ; Narayan, J. ; Heyd, A. R. ; Vedam, K.
Pub. info.: Multilayers : synthesis, properties, and non-electronic applications : symposium held December 2-4, 1987, Boston, Massachusetts, U.S.A..  pp.169-174,  1988.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 103
4.

Conference Proceedings
Conference Proceedings
4. SIMULTANEOUS REAL TIME SPECTROSCOPIC ELLIPSOMETRY AND REFLECTANCE FOR MONITORING SEMICONDUCTOR AND THIN FILM PREPARATION
An, Ilsin ; Nguyen, Hien V. ; Heyd, A. R. ; Collins, R. W.
Pub. info.: Diagnostic techniques for semiconductor materials processing : Symposium held November 29-December 2, 1993, Boston, Massachusetts, U.S.A..  pp.33-,  1994.  Pittsburgh.  MRS - Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 324
5.

Technical Paper
Technical Paper
5. Characterization of High Ge Content SiGe Heterostructures and Graded Alloy Layers Using Spectroscopic Ellipsometry
Heyd, A. R. ; Alterovitz, S. A. ; Croke, E. T.
Pub. info.: NASA Technical Reports.  19970005485  (NASA-TM-112114),  pp.1-8,  1995.  National Aeronautics and Space Adminstration
6.

Technical Paper
Technical Paper
6. Characterization of SiGe/Ge heterostructures and graded layers using variable angle spectroscopic ellipsometry
Croke, E. T. ; Wang, K. L. ; Heyd, A. R. ; Alterovitz, S. A. ; Lee, C. H.
Pub. info.: NASA Technical Reports.  19960038261  (NASA-TM-111685),  pp.1-8,  1996.  National Aeronautics and Space Adminstration