Kirscht, F. ; Snegirev, B. ; Zaumseil, P. ; Kissinger, G. ; Takashima, K. ; Wildes, P. ; Hennessy, J.
Pub. info.:
Proceedings of the Electrochemical Society Symposium on Diagnostic Techniques for Semiconductor Materials and Devices. pp.60-67, 1997. Pennington, NJ. Electrochemical Society