1.

Conference Proceedings
Conference Proceedings
1. Novel method to reduce the surface recombination velocity for the carrier lifetime measurement in silicon wafers
Arndt, W. ; Graff, K. ; Heim, P.
Pub. info.: ALTECH 95 : analytical techniques for semiconductor materials and process characterization II : proceedings of the Satellite Symposium to ESSDERC 95, The Hague, The Netherlands.  pp.44-53,  1995.  Pennington, NJ.  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 95-30
2.

Conference Proceedings
Conference Proceedings
2. High dynamic range vision sensor for automotive applications
Grenet, E. ; Gyger, S. ; Heim, P. ; Heitger, F. ; Kaess, F. ; Nussbaum, P. ; Ruedi, P. -F.
Pub. info.: Photonics in the Automobile.  pp.246-253,  2005.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5663