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13 results

Conference Proceedings

1. Application of fuzzy pattern recognition in intelligent fault diagnosis systems

He,H. ; Wang,D. ; Ma,S.

Pub. info.:	Object detection, classification, and tracking technologies : 22-24 October 2001, Wuhan, China. pp.262-267, 2001. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	4554

Conference Proceedings

2. Design method of machine-learning system used for autonomous land vehicle

He,H. ; Chang,W.

Pub. info.:	Unmanned ground vehicle technology : 7-8 April 1999, Orlando, Florida. pp.282-289, 1999. Bellingham, Wash., USA. SPIE - The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	3693

Conference Proceedings

3. Optical probing of rapid velocity change of miniature object

He,H. ; Kobayashi,T. ; Sekine,T.

Pub. info.:	24th International Congress on High-Speed Photography and Photonics : 24-29 September 2000, Sendai, Japan. pp.476-479, 2000. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	4183

Conference Proceedings

4. Testing system for groove geometry of CD-R substrates

Xu,W. ; Gan,F. ; Shi,H. ; He,H. ; Lin,Q. ; Sun,J. ; Li,X.

Pub. info.:	Fifth International Symposium on Optical Storage (ISOS 2000) : 22-26 May 2000, Shanghai, China. pp.249-252, 2000. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	4085

Conference Proceedings

5. CD-R mastering and stamper quality testing

Zhang,G. ; He,H. ; Chen,G. ; Sun,J. ; Hu,Q. ; Zhou,J. ; Gan,B. ; Xu,Y. ; Sun,F.

Pub. info.:	Fifth International Symposium on Optical Storage (ISOS 2000) : 22-26 May 2000, Shanghai, China. pp.224-227, 2000. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	4085

Conference Proceedings

6. Absolute time in pregroove (ATIP) test system for CD-R disks

He,H. ; Zhang,G.

Pub. info.:	Fifth International Symposium on Optical Storage (ISOS 2000) : 22-26 May 2000, Shanghai, China. pp.237-239, 2000. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	4085

Conference Proceedings

7. Autonomous action control frame for virtual human

He,H. ; Hong,B.

Pub. info.:	Mobile robots XV and telemanipulator and telepresence technologies VII : 5-6 November 2000, Boston, USA. pp.397-404, 2000. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	4195

Conference Proceedings

8. Effects of stoichiometry in semi-insulating GaAs on optoelectronic devices

Chen,N. ; He,H. ; Wang,Y. ; Lin,L.

Pub. info.:	Electro-Optic and second harmonic generation materials, devices, and applications. pp.80-88, 1996. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	2897

Conference Proceedings

9. Subpicosecond Microwave Pulse Generation and Measurement,

Xiao,G. ; Kim,D. ; Liu,Y. ; Zhang,Y. ; He,H.

Pub. info.:	Optics for science and new technology : 17th Congress of the International Commission for Optics, August 19-23, 1996, Hotel Riviera(Yusong), Taejon Korea. Part2 pp.834-835, 1996. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	2778

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Conference Proceedings

10. Microscopic mechanism of Faraday effect in Bi-YIG

Hu,H. ; Wei,J. ; He,H.

Pub. info.:	Optical storage technology : 16-18 September, 1998, Beijing, China. pp.20-23, 1998. Bellingham, Washington. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	3562

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