1.

Conference Proceedings
Conference Proceedings
1. INVITED: COMPUTER SIMULATION OF IMPURITY GET?ERING CAPABILITY IN SILICON FOR CURRENT GETTERING TECHNIQUES
Hayamizu, Y. ; Tobe, S. ; Takeno, H. ; Kitagawara, Y.
Pub. info.: Silicon materials science and technology : proceedings of the Eighth International Symposium on Silicon Materials Science and Technology.  pp.1080-1094,  1998.  Pennington, NJ.  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 98-1(2)
2.

Conference Proceedings
Conference Proceedings
2. Influence of Rapid Thermal Annealing on Thermal Donor Formation and Oxygen Precipitation in Czochralski Silicon
Takeno, H. ; Aihara, K. ; Hayamizu, Y. ; Masui, T. ; Suezawa, M.
Pub. info.: Proceedings of the Third International Symposium on Defects in Silicon.  pp.150-161,  1999.  Pennington, NJ.  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 99-1
3.

Conference Proceedings
Conference Proceedings
3. IMPURITY GETTERING IN SILICON BY THIN POLYCRYSTALLINE FILMS
Hayamizu, Y. ; Ushio, S. ; Takenaka, T.
Pub. info.: Defect engineering in semiconductor growth, processing and device technology : symposium held April 26-May 1, 1992, San Francisco, California, U.S.A..  pp.1005-1010,  1992.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 262
4.

Conference Proceedings
Conference Proceedings
4. INFLUENCE OF HEAVY BORON DOPING ON OXYGEN PRECIPITATION CHARACTERISTICS OF CZOCHRALSKI SILICON CRYSTALS AND ITS COMPUTER SIMULATION
Takeno, H. ; Aihara, K. ; Hayamizu, Y. ; Kitagawara, Y.
Pub. info.: Silicon materials science and technology : proceedings of the Eighth International Symposium on Silicon Materials Science and Technology.  pp.1012-1022,  1998.  Pennington, NJ.  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 98-1(2)
5.

Conference Proceedings
Conference Proceedings
5. Systematic Analyses of Practical Problems Related to Defects and Metallic Impurities in Silicon
Kitagawara, Y. ; Takeno, H. ; Tobe, S. ; Hayamizu, Y. ; Koide, T. ; Takenaka, T.
Pub. info.: Defect and impurity engineered semiconductors, II : symposium held April 13-17, 1998, San Francisco, California, U.S.A..  pp.3-,  1998.  Warrendale, Pa.  MRS - Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 510