Ohyama, H. ; Hakata, T. ; Simoen, E. ; Claeys, C. ; Takami, Y. ; Hayama, K. ; Tokuyama, J. ; Shigaki, K. ; Kobayashi, K. ; Sunaga, H. ; Miyahara, K. ; Hososhima, M.
Pub. info.:
Semiconductors for room-temperature radiation detector applications II : symposium held December 1-5, 1997, Boston, Massachusetts, U.S.A.. pp.429-, 1997. Pittsburgh, PA. MRS - Materials Research Society
Ohyama, H. ; Vanhellemont, J. ; Takami, Y. ; Hayama, K. ; Kudo, T. ; Hakata, T. ; Kobayashi, K. ; Sunaga, H. ; Hironaka, I. ; Poortmans, J. ; Caymax, M.
Pub. info.:
Strained layer epitaxy - materials processing and device applications : symposium held April 17-19, 1995, San Francisco, California, U.S.A.. pp.365-, 1995. Pittsburgh, PA. MRS - Materials Research Society
Ohyama, H. ; Simoen, E. ; Claeys, C. ; Takami, Y. ; Hayama, K. ; Hakata, T. ; Tokuyama, J. ; Kobayashi, K. ; Sunaga, H. ; Poortmans, J. ; Caymax, M.
Pub. info.:
Epitaxy and applications of si-based heterostructures : symposium held April 13-17, 1998, San Francisco, California, U.S.A.. pp.99-, 1998. Warrendale, Pa.. MRS - Materials Research Society
Simoen, E. ; Hayama, K. ; Takakura, K. ; Mercha, A. ; Claeys, C. ; Ohyama, H.
Pub. info.:
Microelectronics technology and devices : SBMICRO 2005 : proceedings of the twentieth international symposium. pp.455-463, 2005. Pennington, N.J.. Electrochemical Society
Poyai, A. ; Simoen, E. ; Claeys, C. ; Hayama, K. ; Kobayashi, K. ; Ohyama, H.
Pub. info.:
Crystalline defects and contamination: their impact and control in device manufacturing III : DECON 2001 : proceedings of the Satellite Symposium to ESSDERC 2001, Nuremberg, Germany. pp.93-102, 2001. Pennington, N.J.. Electrochemical Society