Optical manufacturing and testing IV : 31 July-2 August 2001, San Diego, USA. pp.345-355, 2001. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Optical measurement systems for industrial inspection II : application in industrial design : 18-19 June 2001 Munch, Germany. pp.189-198, 2001. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Chemical microsensors and applications II : 19-20 September 1999, Boston, Massachusetts. pp.52-60, 1999. Bellingham, Wash.. SPIE - The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Optical measurement systems for industrial inspection : 16-17 June 1999, Munich, Germany. pp.229-236, 1999. Bellingham, Wash.. SPIE - The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Laser interferometry X : techniques and analysis : 31 July-1 August 2000, Sandiego, USA. Part B pp.468-476, 2000. Bellingham, Wash.. SPIE - The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Laser interferometry X : techniques and analysis : 31 July-1 August 2000, Sandiego, USA. Part B pp.477-487, 2000. Bellingham, Wash.. SPIE - The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Laser interferometry IX : techniques and analysis : 20-21 July 1998, San Diego, California. pp.294-301, 1998. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering