1.

Conference Proceedings

Conference Proceedings
Min,B.W. ; Han,L.K. ; Joshi,A.B. ; Mann,R. ; Chung,L. ; Kwong,D.-L.
Pub. info.: Microelectronic Manufacturing Yield, Reliability, and Failure Analysis.  pp.156-165,  1995.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 2635
2.

Conference Proceedings

Conference Proceedings
Yan,J. ; Han,L.K. ; Kwong,D.-L.
Pub. info.: Microelectronic Manufacturing Yield, Reliability, and Failure Analysis.  pp.122-127,  1995.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 2635
3.

Conference Proceedings

Conference Proceedings
Han,L.K. ; Wang,H. ; Yan,J. ; Kim,J.H. ; Yoon,G.W. ; Kwong,D.-L.
Pub. info.: Microelectronic Device and Multilevel Interconnection Technology.  pp.208-217,  1995.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 2636
4.

Conference Proceedings

Conference Proceedings
Han,L.K. ; Kwong,D.
Pub. info.: Microelectronic Device and Multilevel Interconnection Technology.  pp.190-197,  1995.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 2636
5.

Conference Proceedings

Conference Proceedings
Wang,H.H. ; Han,L.K. ; Yan,J. ; Kwong,D.-L.
Pub. info.: Microelectronic Device and Multilevel Interconnection Technology.  pp.198-207,  1995.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 2636
6.

Conference Proceedings

Conference Proceedings
Han,L.K. ; Allman,D. ; Kwong,D.-L.
Pub. info.: Microelectronic Device and Multilevel Interconnection Technology.  pp.299-306,  1995.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 2636