1.

Conference Proceedings
Conference Proceedings
1. Normal Incidence Reflectance: A Robust Tool for In Situ Real-Time Measurement of Growth Rates and Optical Constants of CVD-Grown Semiconductor Thin Films
Breiland, W.G. ; Brennan, T.M. ; Chui, H.C. ; Hammons, B.E. ; Killeen, K.P.
Pub. info.: Proceedings of the Symposium on Process control, Diagnostics, and Modeling in Semiconductor Manufacturing.  pp.261-269,  1995.  Pennington, NJ.  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 95-2
2.

Conference Proceedings
Conference Proceedings
2. Advanced Fabrication Technologies for Nano-Electronics
Simmons, J.A. ; Sherwin, M.E. ; Weckwerth, M.V. ; Harff, N.E. ; Eiles, T.M. ; Baca, W.E. ; Hou, H. ; Hammons, B.E.
Pub. info.: Proceedings of the Twenty-fourth State-of-the-Art Program on Compound Semiconductors.  pp.186-202,  1996.  Pennington, NJ.  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 96-2
3.

Conference Proceedings
Conference Proceedings
3. In-Situ Reflectance and Virtual Interface Analysis for Compound Semiconductor Process Control
Breiland, W.G. ; Hong, H.Q. ; Hammons, B.E. ; Klem, J.F.
Pub. info.: Proceedings of the Symposium on Light Emitting Devices for Optoelectronic Applications and the Twenty-Eighth State-of-the-Art Program on Compound Semiconductors.  pp.311-319,  1998.  Pennington, NJ.  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 98-2
4.

Conference Proceedings
Conference Proceedings
4. Wet Oxidation of AlGaAs: Arsenic Barriers on the Road to MIS
Ashby, C.I.H. ; Sullivan, J.P. ; Newcomer, P.P. ; Missert, N.A. ; Hou, H.Q. ; Hammons, B.E. ; Baca, A.G.
Pub. info.: Proceedings of the twenty-sixth State-of-the-Art Program on Compound Semiconductors (SOTAPOCS XXVI).  pp.58-65,  1997.  Pennington, NJ.  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 97-1
5.

Conference Proceedings
Conference Proceedings
5. In Situ Growth Rate Measurements by Normal-Incidence Reflectance During MOVPE Growth
Hou, H.Q. ; Breiland, W.G. ; Hammons, B.E. ; Chui, H.C.
Pub. info.: Proceedings of the Twenty-fourth State-of-the-Art Program on Compound Semiconductors.  pp.27-35,  1996.  Pennington, NJ.  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 96-2