1.

Conference Proceedings
Conference Proceedings
1. X-RAY TOPOGRAPHY AND EBIC STUDIES OF MISFIT DISLOCATIONS IN STRAINED LAYER STRUCTURES
Hamaguchi, N. ; Humphreys, T. P. ; Parker, C. A. ; Bedair, S. M. ; Jiang, B-L. ; Radzimski, Z. J. ; Rozgonyi, G. A.
Pub. info.: Epitaxy of semiconductor layered structures : symposium held November 30-December 4, 1987, Boston, Massachusetts, U.S.A..  pp.541-546,  1988.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 102
2.

Conference Proceedings
Conference Proceedings
2. DEFECT REDUCTION IN GaAs EPILAYERS ON Si SUBSTRATES USING STRAINED LAYER SUPERLATTICES
El-Masry, N. ; Hamaguchi, N. ; Tarn, J. C. L. ; Karam,. N. ; Humphreys, T. P. ; Moore, D. ; Bedair, S. M. ; Lee, J. W. ; Salerno, J. P.
Pub. info.: Heteroepitaxy on silicon II : symposium held April 21-23, 1987, Anaheim, California, U.S.A..  pp.99-104,  1987.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 91