1.

Conference Proceedings

Conference Proceedings
Cole,B. ; Hegmann,F.A. ; Williams,J.B. ; Sherwin,M.S. ; Beeman,J.W. ; Haller,E.E.
Pub. info.: Terahertz spectroscopy and applications : 25-26 January 1999, San Jose, California.  pp.164-173,  1999.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3617
2.

Conference Proceedings

Conference Proceedings
Wynne,D.I. ; Cardozo,B. ; Haller,E.E.
Pub. info.: Hard X-ray, gamma-ray, and neutron detector physics : 19-23 July 1999, Denver, Colorado.  pp.196-203,  1999.  Bellingham, Wash., USA.  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3768
3.

Conference Proceedings

Conference Proceedings
Walton,J.T. ; Haller,E.E. ; Knowlton,W.B. ; Wong,Y.K. ; Ammon,W.V. ; Zulehner,W.
Pub. info.: Proceedings of the Electrochemical Society Symposium on Diagnostic Techniques for Semiconductor Materials and Devices.  pp.400-411,  1997.  Pennington, NJ.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3322
4.

Conference Proceedings

Conference Proceedings
Kreysa,E. ; Gemund,H.-P. ; Gromke,J. ; Haslam,C.G.T. ; Reichertz,L. ; Haller,E.E. ; Beeman,J.W. ; Hansen,V. ; Sievers,A. ; Zylka,R.
Pub. info.: Advanced technology MMW, radio, and terahertz telescopes : 26-28 March 1998, Kona, Hawaii.  pp.319-325,  1998.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3357
5.

Conference Proceedings

Conference Proceedings
Katterloher,R.O. ; Barl,L. ; Jakob,G. ; Konuma,M. ; Haller,E.E. ; Frenzl,O. ; Hermans,L.
Pub. info.: UV, optical, and IR space telescopes and instruments : 29-31 March 2000, Munich, Germany.  pp.100-108,  2000.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4013
6.

Conference Proceedings

Conference Proceedings
Shan,W. ; Walukiewicz,W. ; Yu,K.M. ; III,J.W.Ager ; Haller,E.E. ; Geisz,J.F. ; Friedman,D.J. ; Olson,J.M. ; Kurtz,S.R. ; Xin,H.P. ; Tu,C.W.
Pub. info.: Physics and simulation of optoelectronic devices VIII : 24-28 January 2000, San Jose, USA.  Part1  pp.69-79,  2000.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3944
7.

Conference Proceedings

Conference Proceedings
Schnurr,R. ; Thompson,C.L. ; Davis,J.T. ; Beeman,J.W. ; Cadien,J. ; Young,E.T. ; Haller,E.E. ; Rieke,G.H.
Pub. info.: Infrared astronomical instrumentation : 23-25 March 1998, Kona, Hawaii.  Part 1  pp.322-331,  1998.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3354
8.

Conference Proceedings

Conference Proceedings
Brundermann,E. ; Chamberlin,D.R. ; Haller,E.E.
Pub. info.: Solid state lasers VIII : 25-26 January 1999, San Jose, California.  pp.198-207,  1999.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3613
9.

Conference Proceedings

Conference Proceedings
Schneider,J.W. ; Kiefl,R.F. ; Ansaldo,E.J. ; Brewer,J.H. ; Chow,K. ; Cox,S.F.J. ; Dodds,S.A. ; Duvarney,R.C. ; Estle,T.L. ; Haller,E.E. ; Kadono,R. ; Kreitzman,S.R. ; Lichti,R.L. ; Niedermayer,Ch. ; Riseman,T.M. ; Schwab,C.
Pub. info.: Proceedings of the 16th International Conference on Defects in Semiconductors : Lehigh University, Bethlehem, Pennsylvania, 22-26 July 1991.  Pt.2  pp.569-574,  1992.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 83-87
10.

Conference Proceedings

Conference Proceedings
Walukiewicz,W. ; Yu,K.M. ; Chan,L.Y. ; Jaklevic,J. ; Haller,E.E.
Pub. info.: Proceedings of the 16th International Conference on Defects in Semiconductors : Lehigh University, Bethlehem, Pennsylvania, 22-26 July 1991.  Pt.2  pp.941-946,  1992.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 83-87