1.

Conference Proceedings
Conference Proceedings
1. Isolated substitutional silver and silver-induced defects in silicon:an electron paramagnetic resonance investigation
Hai,P.N. ; Gregorkiewicz,T. ; Ammerlaan,C.A.J. ; Don,D.T.
Pub. info.: Defects in semiconductors, icds-19 : proceedings of the 19th International Conference on Defects in Semiconductors, Aveiro, Portugal, July 1997.  Part1  pp.491-496,  1997.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 258-263
2.

Conference Proceedings
Conference Proceedings
2. Pseudo-Zeeman factors for transition ions in silicon
Ammerlaan,C.A.J. ; Hai,P.N. ; Gregorkiewicz,T.
Pub. info.: Tenth Feofilov Symposium on Spectroscopy of Crystals Activated by Rare-Earth and Transitional-Metal Ions.  pp.305-314,  1996.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 2706