1.

Conference Proceedings
Conference Proceedings
1. Incorporation of measured natural reflectivities in a background clutter simulation
Sheffer, A.D., Jr. ; Cathcart, J.M. ; Hahn, S.R. ; Harbert, S.D.
Pub. info.: Targets and backgrounds X : characterization and representation : 12-13 April 2004, Orlando, Florida, USA.  pp.260-269,  2004.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5431
2.

Conference Proceedings
Conference Proceedings
2. Changes in surface characteristics of HgCdTe by dry etching
Song, K.H. ; Yoon, T.H. ; Hahn, S.R. ; Kim, E.T. ; Kwon, J.H. ; Lee, S.G. ; Hwang, T.S. ; Lee, Y.S. ; Kim, J.M.
Pub. info.: Infrared technology and applications XXIV : 19-24 July 1998, San Diego, California.  Part 1  pp.77-83,  1998.  Bellingham, Wash., USA.  SPIE
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3436
3.

Conference Proceedings
Conference Proceedings
3. ECR Ar/CH4/H2 plasma damage in HgCdTe
Kim, E.T. ; Han, M.S. ; Kwon, J.H. ; Hahn, S.R. ; Song, K.H. ; Lee, S.G. ; Lee, T.S. ; Lee, Y.S. ; Kim, J.M.
Pub. info.: Infrared technology and applications XXIV : 19-24 July 1998, San Diego, California.  Part 1  pp.84-90,  1998.  Bellingham, Wash., USA.  SPIE
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3436
4.

Conference Proceedings
Conference Proceedings
4. Single element photoconductive Hg0.79Cd0.21Te IR detector fabrications and their characteristics
Kim, T.H. ; Han, M.S. ; Jeoung, M.S. ; Kwon, J.H. ; Yim, N.S. ; Lee, G.S. ; Kim, E.T. ; Hahn, S.R. ; Kwon, H.C. ; Bin, Y. ; Jeoung, Y.T. ; Kim, J.M.
Pub. info.: Infrared technology and applications XXIV : 19-24 July 1998, San Diego, California.  Part 1  pp.91-97,  1998.  Bellingham, Wash., USA.  SPIE
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3436