1.

Conference Proceedings
Conference Proceedings
1. Identifying Performance-Critical Defects in the High-κ/Metal Gate Stacks
G.i Bersuker ; D. Hen ; J. Price ; A. Neugroschel ; H. Tseng
Pub. info.: Physics and technology of high-k gate dielectrics 6.  pp.395-410,  2008.  Pennington, NJ.  Electrochemical Society
Title of ser.: ECS transactions
Ser. no.: 16(5)
2.

Conference Proceedings
Conference Proceedings
2. CMOS Scaling For the Next Decade: Trends, Challenges and Opportunities
P. Majhi ; J. Oh ; S. Lee ; R. Harris ; H. Tseng
Pub. info.: Advanced gate stack, source/drain and channel engineering for Si-based CMOS 4 : new materials, processes and equipment.  pp.253-262,  2008.  Pennington, N.J..  Electrochemical Society
Title of ser.: ECS transactions
Ser. no.: 13(1)
3.

Conference Proceedings
Conference Proceedings
3. Martensite transformation and shape memory effect of NiTi-Zr high-temperature shape memory alloys
Z. Pu ; H. Tseng ; K. Wu
Pub. info.: Smart structures and materials 1995 : smart materials.  pp.171-178,  1995.  Bellingham, WA.  Society of Photo-optical Instrumentation Engineers
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 2441