1.

Conference Proceedings

Conference Proceedings
R. Kumashiro ; H. Ohashi ; N. Hiroshiba ; T. Fujiki ; K. Miyazawa
Pub. info.: Fullerenes, Nanotubes, and Carbon Nanostructures 2.  pp.73-77,  2007.  Pennington, N.J..  Electrochemical Society
Title of ser.: ECS transactions
Ser. no.: 6(16)
2.

Conference Proceedings

Conference Proceedings
C. Ota ; J. Nishio ; T. Hatakeyama ; T. Shinohe ; K. Kojima ; S.I. Nishizawa ; H. Ohashi
Pub. info.: Silicon carbide and related materials 2006 : ECSCRM 2006, Proceedings of the 6th European Conference on Silicon Carbide and Related Materials, Newcastle upon Tyne, UK, September 2006.  pp.881-884,  2007.  Stafa-Zuerich.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 556-557
3.

Conference Proceedings

Conference Proceedings
S. Tanimoto ; N. Nishio ; T. Suzuki ; Y. Murakami ; H. Ohashi
Pub. info.: Silicon carbide and related materials 2009 : selected peer reviewed papers from the International Conference on Silicon Carbide and Related Materials 2009, Nurnberg, Germany, October 11-16, 2009.  pp.1139-1142,  2010.  Aedermannsdorf, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 645-648
4.

Conference Proceedings

Conference Proceedings
M. Yabashi ; A. Higashiya ; K. Tamasaku ; H. Kimura ; T. Kudo ; H. Ohashi ; S. Takahashi ; S. Goto ; T. Ishikawa
Pub. info.: Damage to VUV, EUV, and X-ray optics : 18-19 April 2007,Prague, Czech Republic.  2007.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 6586
5.

Conference Proceedings

Conference Proceedings
A. Rommeveaux ; L. Assoufid ; H. Ohashi ; H. Mimura ; K. Yamauchi
Pub. info.: Advances in metrology for x-ray and EUV optics II : 30 August 2007, San Diego, California, USA.  pp.67040B-1-67040B-12,  2007.  Bellingham, Wash..  Society of Photo-optical Instrumentation Engineers
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 6704
6.

Conference Proceedings

Conference Proceedings
H. Ohashi ; T. Tsumura ; H. Okada ; H. Mimura ; T. Masunaga
Pub. info.: Advances in metrology for x-ray and EUV optics II : 30 August 2007, San Diego, California, USA.  pp.670405-1-670405-8,  2007.  Bellingham, Wash..  Society of Photo-optical Instrumentation Engineers
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 6704
7.

Conference Proceedings

Conference Proceedings
T. Mochizuki ; H. Ohashi ; M. Sano ; S. Takahashi ; S. Goto
Pub. info.: Advances in X-ray/EUV optics, components, and applications II : 27-28 August 2007, San Diego, California, USA.  pp.67050U-1-67050U-11,  2007.  Bellingham, Wash..  Society of Photo-optical Instrumentation Engineers
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 6705