1.

Conference Proceedings
Conference Proceedings
1. Improved Current Drivability and Gate Stack Integrity using Buried SiC Layer for Strained Si/SiGe Chaimel Devices
H. Zang ; W. Loh ; H. Oh ; K. Choi ; H. Nguyen ; P. Lo ; B. Cho
Pub. info.: Advanced gate stack, source/drain and channel engineering for Si-based CMOS 3 : new materials, processes and equipment.  pp.105-112,  2007.  Pennington, NJ.  Electrochemical Society
Title of ser.: ECS transactions
Ser. no.: 6(1)
2.

Conference Proceedings
Conference Proceedings
2. GaAs Heteroepitaxy on SiGe-on-Insulator Using Ge Condensation and Migration Enhanced Epitaxy
H. Oh ; K. Choi ; W. Loh ; T. Htoo ; S. Chua ; B. Cho
Pub. info.: Advanced gate stack, source/drain and channel engineering for Si-based CMOS 3 : new materials, processes and equipment.  pp.95-98,  2007.  Pennington, NJ.  Electrochemical Society
Title of ser.: ECS transactions
Ser. no.: 6(1)
3.

Conference Proceedings
Conference Proceedings
3. Charge Capture Kinetics of Nitride Trap in Oxide-Nitride-Oxide Structures
H. Cho ; C. Park ; H. Oh ; D. Kwak ; Y. Lee ; W. Yang ; C. Kim
Pub. info.: Physics and technology of high-k gate dielectrics III.  pp.671-680,  2006.  Pennington, N.J..  Electrochemical Society
Title of ser.: ECS transactions
Ser. no.: 1(5)
4.

Conference Proceedings
Conference Proceedings
4. The Effect of Interfacial Layer of High-K Dielectrics on GaAs Substrate
Y. Tong ; G. K. Dalapati ; H. Oh ; B. Cho
Pub. info.: Advanced gate stack, source/drain and channel engineering for Si-based CMOS 3 : new materials, processes and equipment.  pp.331-338,  2007.  Pennington, NJ.  Electrochemical Society
Title of ser.: ECS transactions
Ser. no.: 6(1)
5.

Technical Paper
Technical Paper
5. Dynamic Continuum Models for Carbon Nanotubes
C. Lee ; H. Oh ; U. Lee
Pub. info.: AIAA meeting papers on disc.  2007.  Reston, Va..  American Institute of Aeronautics and Astronautics
Title of ser.: AIAA Paper : AIAA/ASME/ASCE/AHS/ASC Structures, Structural Dynamics, and Materials Conference
Ser. no.: 2007
6.

Technical Paper
Technical Paper
6. Stability of Fluid Motion in a Vehicle Subject to Harmonic Excitations
J. Kang ; H. Oh
Pub. info.: AIAA meeting papers on disc.  2006.  Reston, Va.  American Institute of Aeronautics and Astronautics
Title of ser.: AIAA Paper : Astrodynamics Specialist Conference
Ser. no.: 2006
7.

Technical Paper
Technical Paper
7. Effect of Scale on the Performance of Heat-Recirculating Reactors
H. Oh ; H. Huh ; J. Ahn ; P. Ronney
Pub. info.: AIAA meeting papers on disc.  2006.  Reston, Va.  American Institute of Aeronautics and Astronautics
Title of ser.: AIAA Paper : International Energy Conversion Engineering Conference and Exhibit (IECEC)
Ser. no.: 2006
8.

Conference Proceedings
Conference Proceedings
8. Photoresist adhesion effect of resist reflow process
J. Park ; J. Lee ; M. Kim ; J. Kim ; S. Lee ; J. Park ; C. Bok ; S. Moon ; S. Park ; J. Hong ; H. Oh
Pub. info.: Advances in resist materials and processing technology XXIV.  2007.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 6519
9.

Conference Proceedings
Conference Proceedings
9. Characteristics and prevention of pattern collapse in EUV lithography
W. Chang ; E. Kim ; Y. Kang ; S. Park ; C. Lim ; K. Won ; J. Kim ; H. Oh
Pub. info.: Emerging lithographic technologies XI.  2007.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 6517
10.

Conference Proceedings
Conference Proceedings
10. 32-nm pattern collapse modeling with radial distance and rinse speed
J. Kim ; W. Chang ; S. Park ; H. Oh ; S. Lee ; S. Kim
Pub. info.: Advances in resist materials and processing technology XXIV.  2007.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 6519