1.

Conference Proceedings

Conference Proceedings
H. Megens ; R. van Haren ; S. Musa ; M. Doytcheva ; S. Lalbahadoersing ; M. van Kemenade ; H. Lee ; P. Hinnen ; F. van Bilsen
Pub. info.: Metrology, inspection, and process control for microlithography XXI.  6518  2007.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 6518
2.

Conference Proceedings

Conference Proceedings
J. Finders ; M. Dusa ; B. Vleeming ; H. Megens ; B. Hepp
Pub. info.: Optical Microlithography XXI.  1  pp.692408-1-692408-12,  2008.  Bellingham, Wash..  Society of Photo-optical Instrumentation Engineers
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 6924
3.

Conference Proceedings

Conference Proceedings
P. Dirksen ; W. de Laat ; H. Megens
Pub. info.: Optical/laser microlithography VIII : 22-24 February, 1995, Santa Clara, California.  pp.701-711,  1995.  Bellingham, WA.  Society of Photo-optical Instrumentation Engineers
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 2440