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Transistor scaling--methods, materials and modeling : symposium held April 18-19, 2006, San Francisco, California, U.S.A.. pp.111-118, 2006. Warrendale, Pa.. Materials Research Society
D. Healy ; D. Braunreiter ; J. Furtek ; H. -W. Chen
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Independent component analyses, wavelets, unsupervised nano-biomimetic sensors, and neural networks VI : 17-19 March 2008, Orlando, Florida, USA. pp.69790V-1-69790V-8, 2008. Bellingham, Wash.. Society of Photo-optical Instrumentation Engineers
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D. Braunreiter ; J. Furtek ; H. -W. Chen ; D. Healy
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Independent component analyses, wavelets, unsupervised nano-biomimetic sensors, and neural networks VI : 17-19 March 2008, Orlando, Florida, USA. pp.69790W-1-69790W-9, 2008. Bellingham, Wash.. Society of Photo-optical Instrumentation Engineers
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Independent component analyses, wavelets, unsupervised nano-biomimetic sensors, and neural networks VI : 17-19 March 2008, Orlando, Florida, USA. pp.69790X-1-69790X-14, 2008. Bellingham, Wash.. Society of Photo-optical Instrumentation Engineers
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