1.

Conference Proceedings
Conference Proceedings
1. THE EFFECT OF Xe ION BEAM TREATMENT ON THE INTERACTION BETWEEN GOLD AND GaAs
Pearton, S. J. ; Pecz, B. ; Radnoczi, G. ; Jorvath, Zs. J. ; Barna, P. B. ; Jaroli, Erika ; Gyulai, J.
Pub. info.: Advanced metallization and processing for semiconductor devices and circuits--II : symposium held April 27-May 1, 1992, San Francisco, California, U.S.A..  pp.293-298,  1992.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 260
2.

Conference Proceedings
Conference Proceedings
2. CHRYSTALLIZATION OF AMORPHOUS SILICON FILMS BY PULSED ION BEAM ANNEALING
Gyulai, J. ; Fastow, R. ; Kavanagh, K. ; Thompson, M. O. ; Palmstrom, C. J. ; Hewett, C. A. ; Mayer, J, W,
Pub. info.: Laser-solid interactions and transient thermal processing of materials : symposium held November 1982 in Boston, Massachusetts, U.S.A..  pp.455-462,  1983.  New York.  North-Holland
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 13
3.

Conference Proceedings
Conference Proceedings
3. ANALYSIS OF HIGH-DOSE IMPLANTED SILICON BY HIGH-DEPTH RESOLUTION RBS AND SPECTROSCOPIC ELLIPSOMETRY AND TEM
Lohner, T. ; Mezey, G. ; Fried, M. ; Ghita, L. ; Ghita, C. ; Mertens, A. ; Kerkow, H. ; Kotai, E. ; Paszti, F. ; Banyai, F. ; Vizkelethy, G. Y. ; Jaroli, E. ; Gyulai, J. ; Somogyi, M.
Pub. info.: Energy beam-solid interactions and transient thermal processing/1984 : symposium held November 26-30, 1984, Boston, Massachusetts, U.S.A..  pp.523-528,  1985.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 35
4.

Conference Proceedings
Conference Proceedings
4. Ion Bombardment Induced Damage in Silicon Carbide Studied by Ion Beam Analytical Methods
Szilagyi, E. ; Khanh, N.Q. ; Horvath, Z.E. ; Lohner, T. ; Battistig, G. ; Zolnai, Z. ; Kotai, E. ; Gyulai, J.
Pub. info.: Silicon carbide and related materials : ECSCRM2000, proceedings of the 3rd European Conference on Silicon Carbide and Related Materials, Kloster Banz, Germany, September 2000.  pp.271-274,  2001.  Uetikon-Zuerich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 353-356
5.

Conference Proceedings
Conference Proceedings
5. FORMATION OF TITANIUM SILICIDE AT ATMOSPHERIC PRESSURE
Revesz, P. ; Gyimesi J. ; Gyulai, J.
Pub. info.: Defects in semiconductors II : symposium held November 1982 in Boston, Massachusetts, U.S.A..  pp.417-422,  1983.  New York.  North-Holland
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 14
6.

Conference Proceedings
Conference Proceedings
6. Ion Beam Analysis and Computer Simulation of Damage Accumulation in Nitrogen Implanted 6H-SiC: Effects of Channeling
Zolnai, Z. ; Ster, A. ; Khanh, N. Q. ; Kotai, E. ; Posselt, M. ; Battistig, G. ; Lohner, T. ; Gyulai, J.
Pub. info.: Silicon carbide and related materials 2004 : ECSCRM 2004 : proceedings of the 5th European Conference on Silicon Carbide and Related Materials, August 31 - September 4 2004, Bologna, Italy.  pp.637-640,  2005.  Uetikon-Zuerich.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 483-485
7.

Conference Proceedings
Conference Proceedings
7. Damage Distributions Induced by Channeling Implantation of Nitrogen into 6H Silicon Carbide
Zolnai, Z. ; Khanh, N.Q. ; Lohner, T. ; Ster, A. ; Kotai, E. ; Vickridge, I. ; Gyulai, J.
Pub. info.: Silicon carbide and related materials 2002 : ECSCRM2002, proceedings of the 4th European Conference on Silicon Carbide and Related Materials, September 2-5, 2002, Linköping, Sweden.  pp.645-648,  2003.  Zuerich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 433-436
8.

Conference Proceedings
Conference Proceedings
8. STM and STS investigation of few-wall carbon nanotubes containing non-hexagonal rings
Osvath, Z. ; Fulcheri, L. ; Mark, G.I. ; Tapaszto, L. ; Gyulai, J. ; Biro, L.P.
Pub. info.: Nanotechnology.  pp.587-593,  2003.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5118