1.

Conference Proceedings

Conference Proceedings
Felix, J. A. ; Shaneyfelt, M. R. ; Schwank, J. R. ; Dodd, P. E. ; Fleetwood, D. M. ; Zhou, X. J. ; Gusev, E. P.
Pub. info.: Defects in high-κ gate dielectric stacks : nano-electronic semiconductor devices.  pp.299-323,  2006.  Dordrecht.  Springer
Title of ser.: NATO science series. Series 2, Mathematics, physics and chemistry
Ser. no.: 220
2.

Conference Proceedings

Conference Proceedings
von Bardeleben, H. J. ; Cantin, J. L. ; Ganem, J. J. ; Trimaille, I. ; Gusev, E. P.
Pub. info.: Defects in high-κ gate dielectric stacks : nano-electronic semiconductor devices.  pp.249-263,  2006.  Dordrecht.  Springer
Title of ser.: NATO science series. Series 2, Mathematics, physics and chemistry
Ser. no.: 220
3.

Conference Proceedings

Conference Proceedings
Gusev, E. P.
Pub. info.: Defects in SiO[2] and related dielectrics : science and technology.  pp.557-580,  2000.  Dordrecht.  Kluwer Academic Publishers
Title of ser.: NATO science series. Series 2, Mathematics, physics and chemistry
Ser. no.: 2
4.

Conference Proceedings

Conference Proceedings
Gusev, E. P. ; Lu, H. C. ; Gustafsson, T. ; Garfunkel, E.
Pub. info.: Interface control of electrical, chemical, and mechanical properties : symposium held November 29-December 3, 1993, Boston, Massachusetts, U.S.A..  pp.69-,  1994.  Pittsburgh.  MRS - Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 318