1.
Conference Proceedings
Felix, J. A. ; Shaneyfelt, M. R. ; Schwank, J. R. ; Dodd, P. E. ; Fleetwood, D. M. ; Zhou, X. J. ; Gusev, E. P.
Pub. info.:
Defects in high-κ gate dielectric stacks : nano-electronic semiconductor devices . pp.299-323, 2006. Dordrecht. Springer
Title of ser.:
NATO science series. Series 2, Mathematics, physics and chemistry
Ser. no.:
220
2.
Conference Proceedings
von Bardeleben, H. J. ; Cantin, J. L. ; Ganem, J. J. ; Trimaille, I. ; Gusev, E. P.
Pub. info.:
Defects in high-κ gate dielectric stacks : nano-electronic semiconductor devices . pp.249-263, 2006. Dordrecht. Springer
Title of ser.:
NATO science series. Series 2, Mathematics, physics and chemistry
Ser. no.:
220
3.
Conference Proceedings
Gusev, E. P.
Pub. info.:
Defects in SiO[2] and related dielectrics : science and technology . pp.557-580, 2000. Dordrecht. Kluwer Academic Publishers
Title of ser.:
NATO science series. Series 2, Mathematics, physics and chemistry
Ser. no.:
2
4.
Conference Proceedings
Gusev, E. P. ; Lu, H. C. ; Gustafsson, T. ; Garfunkel, E.
Pub. info.:
Interface control of electrical, chemical, and mechanical properties : symposium held November 29-December 3, 1993, Boston, Massachusetts, U.S.A. . pp.69-, 1994. Pittsburgh. MRS - Materials Research Society
Title of ser.:
Materials Research Society symposium proceedings
Ser. no.:
318