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Conference Proceedings

1. Airborne microwave radiometric imaging system

Guo,W. ; Li,F. ; Zhang,Z.

Pub. info.:	Earth observing systems IV : 18-20 July 1999, Denver, Colorado. pp.207-209, 1999. Bellingham, Wash., USA. SPIE - The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	3750

Conference Proceedings

2. Multiresolution neural networks for mine detection in side scan sonar images

Guo,W. ; Szymczak,W.G.

Pub. info.:	Detection and remediation technologies for mines and minelike targets III : 13-17 April 1998, Orlando, Florida. Part 1 pp.297-305, 1998. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	3392

Conference Proceedings

3. Mine detection using variational methods for image enhancement and feature extraction

Szymczak,W.G. ; Guo,W. ; Rogers,J.C.W.

Pub. info.:	Detection and remediation technologies for mines and minelike targets III : 13-17 April 1998, Orlando, Florida. Part 1 pp.286-296, 1998. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	3392

Conference Proceedings

4. Diffractive optics for laser welding and bonding

Hammond,J.B. ; Johnson,E.C. ; Koehler,C.S. ; Stack,J.D. ; Suleski,T.J. ; Kar,A. ; Guo,W.

Pub. info.:	Diffractive and holographic technologies, systems, and spatical light modulators VI : 27-29 January 1999, San Jose, California. pp.206-213, 1999. Bellingham, Wash., USA. SPIE - The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	3633

Conference Proceedings

5. Valid methods for improving reliability of the MPU-controlled YAG laser

Liu,Z. ; Zhu,D. ; Guo,W.

Pub. info.:	Instruments for optics and optoelectronic inspection and control, 8-10 November 2000, Beijing, China. pp.165-168, 2000. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	4223

Conference Proceedings

6. New organic material for white OLED

Guo,W. ; Li,E.H. ; Che,C. ; Li,C. ; Liu,S.Y.

Pub. info.:	Organic Light-Emitting Materials and Devices IV. pp.413-418, 2000. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	4105

Conference Proceedings

7. Design of reflective filters based on organic materials using genetic algorithms

Bai,Y.K. ; Djurisic,A.B. ; Guo,W. ; Li,E.H.

Pub. info.:	Organic Photonic Materials and Devices III. pp.132-139, 2001. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	4279

Conference Proceedings

8. Novel material for blue organic light-emitting diode

Guo,W. ; Li,E. ; Che,C. ; Zhao,Y. ; Liu,S.

Pub. info.:	Optoelectronic Materials and Devices II. pp.292-296, 2000. Bellingham, Wash.. SPIE - The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	4078

Conference Proceedings

9. Pseudo multisensor fusion schemes for mine detection in side-scan sonar images

Guo,W. ; Szymczak,W.G.

Pub. info.:	Detection and remediation technologies for mines and minelike targets IV : 5-9 April, 1999, Orlando, Florida. Part1 pp.638-646, 1999. Bellingham, Washington. SPIE - The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	3710

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Conference Proceedings

10. Spectroellipsometric study of buried SiC layers formed by carbon implantation with a metal vapor vacuum arc lon source

Guo,W. ; Zhu,D. ; Liu,Z.

Pub. info.:	Fourth International Conference on Thin Film Physics and Applications : 8-11 May 2000, Shanghai, China : proceedings. pp.565-569, 2000. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	4086

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