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Crystalline defects and contamination: their impact and control in device manufacturing IV : DECON 2005 : proceedings of the Satellite Symposium to ESSDERC 2005, Grenoble, France. pp.42-51, 2005. Pennington, N.J.. Electrochemical Society
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SiGe: materials, processing, and devices : proceedings of the First international symposium. pp.1115-1122, 2004. Pennington, N.J.. Electrochemical Society
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Silicon carbide and related materials - 1999 : ICSCRM'99, proceedings of the International Conference on Silicon Carbide and Related Materials - 1999, Research Triangle Park, North Carolina, USA, October 10-15, 1999. pp.1527-1532, 2000. Zuerich, Switzerland. Trans Tech Publications
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Three-Dimensional and Multidimensional Microscopy: Image Acquisition and Processing XII. pp.146-151, 2005. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering