Infrared imaging systems: design, analysis, modeling, and testing XIV : 23-24 April 2003, Oriando, Florida, USA. pp.169-178, 2003. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Durand, A. ; de Borniol, E. ; Guerineau, N. ; Cathala, T. ; Yon, J.-J. ; Ouvrier-Buffet, J.-L. ; Castelein, P. ; Tronel, R. ; Bisotto, S. ; Destefanis, G.L. ; Chamonal, J.-P.
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Infrared imaging systems: design, analysis, modeling, and testing XV : 14-15 April 2004, Oriando, Florida, USA. pp.189-200, 2004. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Velghe, S. ; Primot, J. ; Guerineau, N. ; Cohen, M. ; Wattellier, B.
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Optical fabrication, testing and metrology II : 13-15 September 2005, Jena, Germany. pp.596512-596512, 2005. Bellingham, Wash., USA. SPIE - The International Society of Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Rommeluere, S. ; Guerineau, N. ; Deschamps, J. ; De Borniol, E. ; Millon, A. ; Chamonal, J. -P. ; Destefanis, G.
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Detectors and associated signal processing II : 13-14 September 2005, Jena, Germany. pp.59640E-, 2005. Bellingham, Wash., USA. SPIE - The International Society of Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Velghe, S. ; Primot, J. ; Guerineau, N. ; Haidar, R. ; Cohen, M. ; Wattellier, B.
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Eighth International Symposium on Laser Metrology : macro-, micro-, and nano-technologies applied in science, engineering, and industry : 14-18 February, 2005, Merida, Yucatan, Mexico. pp.134-143, 2005. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Le Rouzo, J. ; Ribet-Mohamed, I. ; Guerineau, N. ; Tauvy, M. ; Schneider, H. ; Maier, T.
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Infrared technology and applications XXXI : 28 March-1 April 2005, Orlando, Florida, USA. pp.747-754, 2005. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Guerineau, N. ; Suffis, S. ; Cymbalista, P. ; Primot, J.
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Optical design and engineering : 30 September-3 October 2003, St. Etienne, France. pp.441-448, 2004. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Guerineau, N. ; Harchaoui, B. ; Caes, M. ; Durand, A. ; Castelein, P.
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Optical design and engineering : 30 September-3 October 2003, St. Etienne, France. pp.433-440, 2004. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering