1.

Conference Proceedings
Conference Proceedings
1. Many-electron effects in the negative silicon vacancy
Anderson,F.G. ; Ham,F.S. ; Grossman,G.
Pub. info.: Proceedings of the 16th International Conference on Defects in Semiconductors : Lehigh University, Bethlehem, Pennsylvania, 22-26 July 1991.  Pt.1  pp.475-480,  1992.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 83-87
2.

Conference Proceedings
Conference Proceedings
2. Spectroscopy on transition-metal defects in silicon
Kleverman,M. ; Thilderkvist,A. ; Grossman,G. ; Grimmeiss,H.G.
Pub. info.: Proceedings of the 16th International Conference on Defects in Semiconductors : Lehigh University, Bethlehem, Pennsylvania, 22-26 July 1991.  Pt.1  pp.125-136,  1992.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 83-87