1.

Conference Proceedings
Conference Proceedings
1. *TRANSITION METAL EXCITED STATES IN SILICON
Kleverman, M. ; Olajos, J. ; Grossman, G. ; Grimmeiss, H. G.
Pub. info.: Defects in electronic materials : symposium held November 30-December 3, 1987, Boston, Massachusetts, U.S.A..  pp.141-152,  1988.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 104
2.

Conference Proceedings
Conference Proceedings
2. *ELECTRONIC DEFECT CHARACTERIZATION
Grimmeiss, H. G.
Pub. info.: Microscopic identification of electronic defects in semiconductors : symposium held April 15-18, 1985, San Francisco, California, U.S.A..  pp.39-60,  1985.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 46
3.

Conference Proceedings
Conference Proceedings
3. CHARACTERIZATION OF VALENCE BAND OFFSETS IN P-Si/SiGe/Si BY SPACE CHARGE SPECTROSCOPY
Schmalz, K. ; Rucker, H. ; Yassievich, I. N. ; Grimmeiss, H. G. ; Mehr, W. ; Frankenfeld, H. ; Osten, H. J. ; Schley, P. ; Babanskaya, I.
Pub. info.: Growth, processing, and characterization of semiconductor heterostructures : Symposium held November 29-December 2, 1993, Massachusetts, U.S.A..  pp.389-,  1994.  Pittsburgh.  MRS - Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 326