Flatte, Michael E. ; Grein, C. H. ; Olesberg, J. T. ; Boggess, T. F.
Pub. info.:
Infrared applications of semiconductors - materials, processing, and devices : symposium held December 2-5, 1996, Boston, Massachusetts, U.S.A. pp.85-, 1997. Pittsburgh, Pa.. MRS - Materials Research Society
Flatte, Michael E. ; Olesberg, J. T. ; Grein, C. H.
Pub. info.:
Infrared applications of semiconductors II : symposium held December 1-4, 1997, Boston, Massachusetts, U.S.A.. pp.71-, 1998. Pittsburgh, PA. MRS - Materials Research Society
Infrared applications of semiconductors II : symposium held December 1-4, 1997, Boston, Massachusetts, U.S.A.. pp.191-, 1998. Pittsburgh, PA. MRS - Materials Research Society
Olesberg, J. T. ; Boggess, Thomas F. ; Anson, S. A. ; Jang, D-J. ; Flatte, M. E. ; Hasenberg, T. C. ; Grein, C. H.
Pub. info.:
Infrared applications of semiconductors II : symposium held December 1-4, 1997, Boston, Massachusetts, U.S.A.. pp.83-, 1998. Pittsburgh, PA. MRS - Materials Research Society
Materials for infrared detectors III : 7-8 August 2003, San Diego, California, USA. pp.90-98, 2003. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Velicu, S. ; Lee, T. S. ; Ashokan, R. ; Grein, C. H. ; Boieriu, P. ; Chen, Y. P. ; Dinan, J. H. ; Lianos, D.
Pub. info.:
Materials for infrared detectors III : 7-8 August 2003, San Diego, California, USA. pp.14-32, 2003. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
State-of-the-art program on compound semiconductors XXXVII (SOTAPOCS XXXVII) and narrow bandgap optoelectronic materials and devices : proceedings of the international symposia. pp.80-87, 2002. Pennington, N.J.. Electrochemical Society
Lee, T. S. ; Becker, C. R. ; Grein, C. H. ; Sivananthan, S. ; Nathan, V.
Pub. info.:
Materials for infrared detectors III : 7-8 August 2003, San Diego, California, USA. pp.75-89, 2003. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering