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21 results

Conference Proceedings

1. Isolated substitutional silver and silver-induced defects in silicon:an electron paramagnetic resonance investigation

Hai,P.N. ; Gregorkiewicz,T. ; Ammerlaan,C.A.J. ; Don,D.T.

Pub. info.:	Defects in semiconductors, icds-19 : proceedings of the 19th International Conference on Defects in Semiconductors, Aveiro, Portugal, July 1997. Part1 pp.491-496, 1997. Zurich, Switzerland. Trans Tech Publications
Title of ser.:	Materials science forum
Ser. no.:	258-263

Conference Proceedings

2. High-field EPR speetroscopy of thermal donors in silicon

Dirksen,R. ; Rasmussen,F.Berg ; Gregorkiewicz,T. ; Ammerlaan,C.A.J.

Pub. info.:	Defects in semiconductors, icds-19 : proceedings of the 19th International Conference on Defects in Semiconductors, Aveiro, Portugal, July 1997. Part1 pp.373-378, 1997. Zurich, Switzerland. Trans Tech Publications
Title of ser.:	Materials science forum
Ser. no.:	258-263

Conference Proceedings

3. Passivation of Electronic Centres in Silicon by Hydrogen

Ammerlaan,C.A.J. ; Zevenbergen,I.S. ; Gregorkiewicz,T.

Pub. info.:	Physics of - Semiconductor Devices -. Part 1 pp.531-538, 1998. New Delhi. Narosa Publishing House
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	3316

Conference Proceedings

4. Silicon thermal donors:photoluminescence and magnetic resonance study of boron- and aluminum-doped silicon

Liesert,B.J.Heijmink ; Gregorkiewicz,T. ; Ammerlaan,C.A.J.

Pub. info.:	Proceedings of the 16th International Conference on Defects in Semiconductors : Lehigh University, Bethlehem, Pennsylvania, 22-26 July 1991. Pt.1 pp.407-412, 1992. Zurich, Switzerland. Trans Tech Publications
Title of ser.:	Materials science forum
Ser. no.:	83-87

Conference Proceedings

5. High-Resolution EPR Spectroscopy of the Si-NL 10 Thermal Donor

Gregorkiewicz,T. ; Bekamn,H.H.P.Th. ; Ammerlaan,C.A.J. ; Knap,W. ; Brunel,L.C. ; Martinez,G.

Pub. info.:	Shallow Impurities in Semiconductors : Proceedings of the Fifth International Conference on Shallow Impurities in Semiconductors "Physics and Control of Impurities", International Conference Center Kobe, Japan, 5 to 8 August, 1992. pp.521-522, 1993. Aedermannsdorf, Switzerland. Trans Tech Publications
Title of ser.:	Materials science forum
Ser. no.:	117-118

Conference Proceedings

6. EPR Study of Platinum-Hydrogen Complexes in Silicon

Hohne,M. ; Juda,U. ; Martynov,Yu.V. ; Gregorkiewicz,T. ; Ammerlaan,C.A.J. ; Vlasenko,L.S.

Pub. info.:	Proceedings of the 17th International Conference on Defects in Semiconductors : ICDS-17, Gmunden, Austria, July 18-23, 1993. Pt.3 pp.1659-1663, 1994. Zurich, Switzerland. Trans Tech Publications
Title of ser.:	Materials science forum
Ser. no.:	143-147

Conference Proceedings

7. Photoluminescence study of erbium in silicon with a free-electron laser

Tsimperidis,I. ; Gregorkiewicz,T. ; Bekman,H.P.Th. ; Langerak,C.J.G.M. ; Ammerlaan,C.A.J.

Pub. info.:	Defects in semiconductors, icds-19 : proceedings of the 19th International Conference on Defects in Semiconductors, Aveiro, Portugal, July 1997. Part3 pp.1497-1502, 1997. Zurich, Switzerland. Trans Tech Publications
Title of ser.:	Materials science forum
Ser. no.:	258-263

Conference Proceedings

8. The NL1O Thermal Donor in Silicon

Bekman,H.H.P.Th. ; Gregorkiewicz,T. ; Ammerlaan,C.A.J.

Pub. info.:	Proceedings of the 15th International Conference on Defects in Semiconductors : Budapest, Hungary, August 22-26, 1988. Part2 pp.601-606, 1989. Aederlmannsdorf, Switzwelns. Trans Tech Publications
Title of ser.:	Materials science forum
Ser. no.:	38-41

Conference Proceedings

9. Heat-Treatment Centres and Thermal Donors in Silicon

Gregorkiewicz,T. ; Bekman,H.H.P.Th. ; Ammerlaan,C.A.J.

Pub. info.:	Proceedings of the 15th International Conference on Defects in Semiconductors : Budapest, Hungary, August 22-26, 1988. Part2 pp.595-600, 1989. Aederlmannsdorf, Switzwelns. Trans Tech Publications
Title of ser.:	Materials science forum
Ser. no.:	38-41

10.

Conference Proceedings

10. Shailow thermal donors in annealed CZ silicon and links to the NL1O EPR spectrum:the reievance of H,Al and N imporities

Newman,R.C. ; Ashwin,M.J. ; Pritcbard,R.E ; Tucker,J.H. ; Lightowlers,E.C. ; Gregorkiewicz,T. ; Zevenbergen,I.S. ; Ammeriaan,C.A.J. ; Falster,R. ; Binns,M.J.

Pub. info.:	Defects in semiconductors, icds-19 : proceedings of the 19th International Conference on Defects in Semiconductors, Aveiro, Portugal, July 1997. Part1 pp.379-384, 1997. Zurich, Switzerland. Trans Tech Publications
Title of ser.:	Materials science forum
Ser. no.:	258-263

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