1.

Conference Proceedings
Conference Proceedings
1. Can DUV take us below 100 nm?
Finders,J. ; Jorritsma,L. ; Eurlings,M. ; Moerman,R. ; Greevenbroek,H.van ; Schoot,J.B.van ; Flagello,D.G. ; Socha,R.J. ; Stammler,T.
Pub. info.: Optical Microlithography XIV.  4346  pp.153-165,  2001.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4346
2.

Conference Proceedings
Conference Proceedings
2. Aerial image measurement methods for fast aberration set-up and illumination pupil verification
Laan,H.van der ; Dierichs,M. ; Greevenbroek,H.van ; McCoo,E. ; Stoffels,F. ; Pongers,R. ; Willekers,R.
Pub. info.: Optical Microlithography XIV.  4346  pp.394-407,  2001.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4346