1.
Conference Proceedings
Job, R. ; Borchert, D. ; Bumay, Yu. A. ; Fahrner, W. R. ; Grabosch, G. ; Khorunzhii, I. A. ; Ulyashin, A. G.
Pub. info.:
Defects and diffusion in silicon processing : symposium held April 1-4, 1997, San Francisco, California, U.S.A. . pp.101-, 1997. Pittsburg, Pa.. MRS - Materials Research Society
Title of ser.:
Materials Research Society symposium proceedings
Ser. no.:
469
2.
Conference Proceedings
Hahn, J. ; Grabosch, G. ; Parthier, L. ; Knapp, K.
Pub. info.:
Optical Microlithography XVI . Part Two pp.734-741, 2003. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
5040
3.
Conference Proceedings
Grabosch, G. ; Parthier, L. ; Kruell, P. ; Knapp, K.
Pub. info.:
Optical Microlithography XVII . pp.1781-1786, 2004. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
5377
4.
Conference Proceedings
Grabosch, G. ; Parthier, L. ; Natura, U. ; Pobi, K. ; Letz, M. ; Miihlig, C. ; Knapp, K.
Pub. info.:
Laser-Induced Damage in Optical Materials: 2004 . pp.313-313, 2004. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
5647