1.

Technical Paper
Technical Paper
1. Performance of Conductive Pre-Primers Applied on Galvanized Steel Sheets for Automotive Bodies.
Santos, D. ; Raminhos, H. ; Costa, M. ; Diamantino, T. ; Goodwin, F.
Pub. info.: 2007 SAE world congress : technical paper.  2007.  Warrendale, Penn..  Society of Automotive Engineers
Title of ser.: Society of Automotive Engineers technical paper series
Ser. no.: 2007
2.

Technical Paper
Technical Paper
2. Improving the Relationship between Processing and Properties of Zine Die Casting: Developments in Creep and Ageing Correlations.
Goodwin, F. ; Kallien, L.
Pub. info.: 2011 SAE world congress : technical paper.  2011.  Warrendale, Penn..  Society of Automotive Engineers
Title of ser.: Society of Automotive Engineers technical paper series
Ser. no.: 2011
3.

Conference Proceedings
Conference Proceedings
3. A year in the life of an immersion lithography alpha tool at Albany Nanotech (Keynote Address) [6151-01]
Tittnich, M ; Hartley, J ; Denbeaux, G ; Okoroanyanwu, U. ; Levinson, H ; Petrillo, K. ; Robinson, C. ; Gil, D. ; Corliss, D. ; Back, D ; Brandl, S ; Schwarz, C ; Goodwin, F. ; Wei, Y. ; Martinick, B. ; Housley, R. ; Benson, P. ; Cummings, K
Pub. info.: Emerging Lithographic Technologies X.  pp.615101-,  2006.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 6151
4.

Conference Proceedings
Conference Proceedings
4. Investigation of immersion related defects using pre-and post-wet experiments [6154-29]
Brandl, S. ; Watso, R. ; Pierson, B. ; Holmes, S. ; Wei, Y. ; Petrillo, K. ; Cummings, K. ; Goodwin, F.
Pub. info.: Optical Microlithography XIX.  pp.61540T-,  2006.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 6154
5.

Conference Proceedings
Conference Proceedings
5. Segmented alignment mark optimization and signal strength enhancement for deep trench process
Cui, Y. ; Goodwin, F. ; van Haren, R.
Pub. info.: Metrology, Inspection, and Process Control for Microlithography XVIII.  pp.1265-1277,  2004.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5375