Khoury, J. ; Woods, C.L. ; Haji-Saeed, B. ; Sengupta, S.K. ; Megherbi, D.B. ; Goodhue, W.D. ; Kierstead, J.
Pub. info.:
Optical pattern recognition XV : 15-16 April 2004, Orlando, Florida, USA. pp.288-292, 2004. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Vangala, S.R. ; Krejca, B. ; Kristmaswami, K. ; Dauplaise, H. ; Qian, X. ; Zhu, B. ; Ospina, M. ; Sung, C. ; Vaccaro, K. ; Bliss, D. ; Goodhue, W.D.
Pub. info.:
Radiation effects and ion-beam processing of materials : symposium held December 1-5, 2003, Boston, Massachusetts, U.S.A.. pp.569-574, 2004. Warrendale, PA. Materials Research Society
Krejca, B. ; Vangala, S.R ; Krishnaswami, K. ; Kolluru, R. ; Ospina, M.C. ; Sung, C. ; Goodhue, W.D.
Pub. info.:
Radiation effects and ion-beam processing of materials : symposium held December 1-5, 2003, Boston, Massachusetts, U.S.A.. pp.309-314, 2004. Warrendale, PA. Materials Research Society
Haji-Saeed, B. ; Sengupta, S.K. ; Testorf, M.E. ; Megherbi, D.B. ; Goodhue, W.D. ; Khoury, J. ; Woods, C.L. ; Kierstead, J.
Pub. info.:
Optical pattern recognition XV : 15-16 April 2004, Orlando, Florida, USA. pp.146-152, 2004. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Haji-Saeed, B. ; Kolluru, R. ; Pyburn, D. ; Leon, R. ; Sengupta, S.K. ; Testorf, M.E. ; Goodhue, W.D. ; Khoury, J. ; Drehman, A.J. ; Woods, C.L. ; Kierstead, J.
Pub. info.:
Optical pattern recognition XV : 15-16 April 2004, Orlando, Florida, USA. pp.115-122, 2004. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering