1.

Conference Proceedings

Conference Proceedings
Thomas, C.E., Jr. ; Bahm, T.M. ; Baylor, L.R. ; Bingham, P.R. ; Burns, S.W. ; Chidley, M.D. ; Dai, X.L. ; Delahanty, R.J. ; Doti, C.J. ; El-Khashab, A. ; Fisher, R.L. ; Gilbert, J.M. ; Goddard, J.S. ; Hanson, G.R. ; Hickson, J.D. ; Hunt, M.A. ; Hylton, K.W. ; John, G.C. ; Jones, M.L. ; MacDonald, K.R. ; Mayo, M.W. ; McMackin, I. ; Patek, D.R. ; Price, J.H. ; Rasmussen, D.A. ; Schaefer, L.J. ; Scheidt, T.R. ; Schulze, M.A. ; Schumaker, P.D. ; Shen, B. ; Smith, R.G. ; Su, A.N. ; Tobin, K.W., Jr. ; Usry, W.R. ; voelkl, E. ; Weber, K.S. ; Jones, P.G. ; Owen, R.W.
Pub. info.: Design, process integration, and characterization for microelectronics : 6-7 March 2002, Santa Clara, USA.  pp.180-194,  2002.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4692
2.

Conference Proceedings

Conference Proceedings
Baba, J.S. ; Gleason, S.S. ; Goddard, J.S. ; Paulus, M.J.
Pub. info.: Optical Diagnostics and Sensing V.  pp.97-103,  2005.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5702
3.

Conference Proceedings

Conference Proceedings
Kerekes, R.A. ; Goddard, J.S. ; Gleason, S.S. ; Paulus, M.J. ; Weisenberger, A.G. ; Smith, M.F. ; Welch, B.
Pub. info.: Sixth International Conference on Quality Control by Artificial Vision.  pp.129-139,  2003.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5132