1.

Conference Proceedings
Conference Proceedings
1. Detection of semiconductor defects using a novel fractal encoding algorithm
Gleason, S.S. ; Ferrell, R.K. ; Karnowski, T.P. ; Tobin, K.W., Jr.
Pub. info.: Design, process integration, and characterization for microelectronics : 6-7 March 2002, Santa Clara, USA.  pp.61-71,  2002.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4692
2.

Conference Proceedings
Conference Proceedings
2. An Integrated Spatial Signature Analysis and Automatic Defect Classification System
Gleason, S.S. ; Tobin, K.W. ; Karnowski, T.P.
Pub. info.: Proceedings of the Electrochemical Society Symposium on Diagnostic Techniques for Semiconductor Materials and Devices.  pp.204-211,  1997.  Pennington, NJ.  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 97-12
3.

Conference Proceedings
Conference Proceedings
3. Application of polarization for optical motion-registered SPECT functional imaging of tumors in mice
Baba, J.S. ; Gleason, S.S. ; Goddard, J.S. ; Paulus, M.J.
Pub. info.: Optical Diagnostics and Sensing V.  pp.97-103,  2005.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5702
4.

Conference Proceedings
Conference Proceedings
4. Application of fractal encoding techniques for image segmentation
Ferrell, R.K. ; Gleason, S.S. ; Tobin, K.W., Jr.
Pub. info.: Sixth International Conference on Quality Control by Artificial Vision.  pp.69-77,  2003.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5132
5.

Conference Proceedings
Conference Proceedings
5. Two methods for tracking small animals in SPECT imaging
Kerekes, R.A. ; Goddard, J.S. ; Gleason, S.S. ; Paulus, M.J. ; Weisenberger, A.G. ; Smith, M.F. ; Welch, B.
Pub. info.: Sixth International Conference on Quality Control by Artificial Vision.  pp.129-139,  2003.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5132
6.

Technical Paper
Technical Paper
6. Fuzzy Logic Connectivity in Semiconductor Defect Clustering
Karnowski, T.P. ; Gleason, S.S. ; Tobin, K.W., Jr.
Pub. info.: SME technical paper.  2001.  Society of Manufacturing Engineers