Microscopic identification of electronic defects in semiconductors : symposium held April 15-18, 1985, San Francisco, California, U.S.A.. pp.425-432, 1985. Pittsburgh, Pa.. Materials Research Society
Chen, W. M. ; Godlewski, M. ; Monemar, B. ; Gislason, H. P.
Pub. info.:
Defects in electronic materials : symposium held November 30-December 3, 1987, Boston, Massachusetts, U.S.A.. pp.443-448, 1988. Pittsburgh, Pa.. Materials Research Society
Chen, W. M. ; Godlewski, M. ; Monemar, B. ; Gislason, H. P.
Pub. info.:
Defects in electronic materials : symposium held November 30-December 3, 1987, Boston, Massachusetts, U.S.A.. pp.467-470, 1988. Pittsburgh, Pa.. Materials Research Society
Defects in electronic materials II : symposium held December 2-6, 1996, Boston, Massachusetts, U.S.A.. pp.453-, 1997. Pittsburgh, Penn. MRS - Materials Research Society
Sveinbjornsson, E. O. ; Kristjansson, S. ; Engstrom, O. ; Gislason, H. P.
Pub. info.:
Defect and impurity engineered semiconductors and devices : symposium held April 17-21, 1995, San Francisco, California, U.S.A.. pp.371-, 1995. Pittsburgh, PA. MRS - Materials Research Society
Defects in electronic materials II : symposium held December 2-6, 1996, Boston, Massachusetts, U.S.A.. pp.573-, 1997. Pittsburgh, Penn. MRS - Materials Research Society