1.

Conference Proceedings
Conference Proceedings
1. Nucleation of oxidation induced stacking faults (01SF) in ion implanted SIMOX structures
Giles, L.F. ; Nejim, A. ; Cristiano, F. ; Hemment, P.L.F.
Pub. info.: Proceedings of the Sixth International Symposium on Silicon-on-Insulator Technology and Devices.  pp.98-103,  1994.  Pennington, NJ.  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 1994-11
2.

Conference Proceedings
Conference Proceedings
2. Delineation of crystallographic defects in ultra thin SIMOX materials produced by low energy low dose oxygen implantation
Giles, L.F. ; Meyyappan, N. ; Nejim, A. ; Blake, J. ; Cristiano, F. ; Hemment, P.L.F.
Pub. info.: Proceedings of the Sixth International Symposium on Silicon-on-Insulator Technology and Devices.  pp.50-56,  1994.  Pennington, NJ.  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 1994-11