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14 results

Conference Proceedings

1. REDUCTION OF STRAIN IN EPITAXIAL GaAs ON CaF2/Si SUBSTRATES

Hashimoto, Shin ; Schowalter, L.J. ; Smith, G.A. ; Lee, E.Y. ; Gibson, W.M. ; Claxton, P.A.

Pub. info.:	Heteroepitaxy on silicon : fundamentals, structure, and devices : symposium held April 5-8, 1988, Reno, Nevada, U.S.A.. pp.257-260, 1988. Pittsburgh, Pa.. Materials Research Society
Title of ser.:	Materials Research Society symposium proceedings
Ser. no.:	116

Conference Proceedings

2. EPITAXIAL GROWTH OF SILICON ON CoSi2(001)/Si(001)

Xiao, Q.F. ; Jimenez, J.R. ; Schowalter, L.J. ; Luo, L. ; Mitchell, T.E. ; Gibson, W.M.

Pub. info.:	Silicon molecular beam epitaxy : symposium held April 29-May 3, 1991, Anaheim, California, U.S.A.. pp.519-524, 1991. Pittsburgh, Pa.. Materials Research Society
Title of ser.:	Materials Research Society symposium proceedings
Ser. no.:	220

Conference Proceedings

3. GROWTH OF THIN NICKEL SILICIDE LAYERS ON CLEAN B-DOPED Si (111) SURFACES AT ROOM TEMPERATURE

Luo, L. ; Smith, G.A. ; Gibson, W.M.

Pub. info.:	Layered structures : heteroepitaxy, superlattices, strain, and metastability : symposium held November 27-December 1, 1989, Boston, Massachusetts, U.S.A.. pp.263-268, 1990. Pittsburgh, Pa.. Materials Research Society
Title of ser.:	Materials Research Society symposium proceedings
Ser. no.:	160

Conference Proceedings

4. STRAIN IN EPITAXIAL GaAs ON CaF2/Si (111)

Schowalter, L.J. ; Ayers, J.E. ; Ghandhi, S.K. ; Hashimoto, Shin ; Gibson, W.M. ; LeGoues, F.K. ; Claxton, F.A.

Pub. info.:	Layered structures : heteroepitaxy, superlattices, strain, and metastability : symposium held November 27-December 1, 1989, Boston, Massachusetts, U.S.A.. pp.527-532, 1990. Pittsburgh, Pa.. Materials Research Society
Title of ser.:	Materials Research Society symposium proceedings
Ser. no.:	160

Conference Proceedings

5. STRAIN MEASUREMENT IN EPITAXIAL NiSi2/Si(111) BY MeV ION CHANNELING

Okamoto, Masako ; Hashimoto, Shin ; Hunt, B.D. ; Schowalter, L.J. ; Gibson, W.M.

Pub. info.:	Layered structures and epitaxy : symposium held December 2-4, 1985, Boston, Massachusetts, U.S.A.. pp.157-162, 1985. Pittsburgh, Pa.. Materials Research Society
Title of ser.:	Materials Research Society symposium proceedings
Ser. no.:	56

Conference Proceedings

6. A NEW APPLICATION OF RB-PIXE WITH HIGH ENERGY MICROBEAM

Raicu, B. ; Bakhrum, H. ; Fesseha, S. ; Gibson, W.M.

Pub. info.:	Materials characterization : symposium held April 15-17, 1986, Palo Alto California, U.S.A.. pp.293-298, 1986. Pittsburgh, Pa.. Materials Research Society
Title of ser.:	Materials Research Society symposium proceedings
Ser. no.:	69

Conference Proceedings

7. STRAIN AND REORDERING IN CaF2/Si(111) EPITAXY

Hashimoto, Shin ; Schowalter, L.J. ; Fathauer, R.W. ; Gibson, W.M.

Pub. info.:	Layered structures and epitaxy : symposium held December 2-4, 1985, Boston, Massachusetts, U.S.A.. pp.247-252, 1985. Pittsburgh, Pa.. Materials Research Society
Title of ser.:	Materials Research Society symposium proceedings
Ser. no.:	56

Conference Proceedings

8. DEFECT STRUCTURE ANALYSIS OF THICK EPITAXIAL FILMS WITH VERY LARGE LATTICE MISMATCH: Ag/Si(111) AND Ag/Si (001)

Park, K.-H. ; Smith, G.A. ; McKenna, D.C. ; Luo, L. ; Jin, H.-S. ; Gibson, W.M. ; Rajan, K. ; Lu, T.-M. ; Wang, G.-C.

Pub. info.:	Characterization of the structure and chemistry of defects in materials : symposium held November 28-December 3, 1988, Boston, Massachusetts, U.S.A.. pp.545-550, 1989. Pittsburgh, Pa.. Materials Research Society
Title of ser.:	Materials Research Society symposium proceedings
Ser. no.:	138

Conference Proceedings

9. Simulation study of polycapillary x-ray optics

Wang, Hui ; Wang, Lei ; Gibson, W.M. ; MacDonald, C.A.

Pub. info.:	X-ray optics, instruments, and missions : 19-22 July 1998, San Diego, California. pp.643-651, 1998. Bellingham, Wash.. SPIE
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	3444

10.

Conference Proceedings

10. Potential application of doubly curved crystal optics

Mail, N. ; MacDonald, C.A. ; Chen, Z.W. ; Gibson, W.M.

Pub. info.:	X-ray sources and optics : 2-3 August 2004, Denver, Colorado, USA. pp.94-104, 2004. Bellingham, Wash., USA. SPIE - The International Society of Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	5537

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Author: Gibson, W.M.