Defects in semiconductors, icds-19 : proceedings of the 19th International Conference on Defects in Semiconductors, Aveiro, Portugal, July 1997. Part3 pp.1583-1588, 1997. Zurich, Switzerland. Trans Tech Publications
Ultrafast phenomena in semiconductors IV : 27-28 January 2000, San Jose, California. pp.16-26, 2000. Bellingham, Wash.. SPIE - The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Physics and simulation of optoelectronic devices VII : 25-29 January 1999, San Jose, USA. pp.80-87, 1999. Bellingham, Wash.. SPIE - The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Ultrafast phenomena in semiconductors III : 27-29 January, 1999, San Jose, California. pp.216-223, 1999. Bellingham, Wash.. SPIE - The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Defects in semiconductors, icds-19 : proceedings of the 19th International Conference on Defects in Semiconductors, Aveiro, Portugal, July 1997. Part3 pp.1701-1706, 1997. Zurich, Switzerland. Trans Tech Publications
Defects in semiconductors, icds-19 : proceedings of the 19th International Conference on Defects in Semiconductors, Aveiro, Portugal, July 1997. Part3 pp.1625-1630, 1997. Zurich, Switzerland. Trans Tech Publications