1.

Conference Proceedings
Conference Proceedings
1. High-temperature single-hole silicon transistors
Bagraev,N.T. ; Gehlhoff,W. ; Klyachkin,L.E. ; Malyarenko,A.M. ; Naser,A. ; Romanov,V.V.
Pub. info.: International Workshop on New Approaches to High-Tech Materials, Nondestructive Testing and Computer Simulations in Materials Science and Engineering : 9-13 June 1997, St. Petersburg, Russia.  pp.166-174,  1998.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3345
2.

Conference Proceedings
Conference Proceedings
2. Electron paramagnetic resonance identification of a trigonal Fe-S pair in GaP
Kreissl,J. ; Ulrici,W. ; Gehlhoff,W.
Pub. info.: Proceedings of the 16th International Conference on Defects in Semiconductors : Lehigh University, Bethlehem, Pennsylvania, 22-26 July 1991.  Pt.2  pp.719-722,  1992.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 83-87
3.

Conference Proceedings
Conference Proceedings
3. Quantum interference and conductance in silicon quantum wires
Bagraev,N.T. ; Gehlhoff,W. ; lvanov,V.K. ; Klyachkin,L.E. ; Malyarenko,A.M. ; Naeser,A. ; Rykov,S.A. ; Shelykh,I.A.
Pub. info.: International Workshop on Nondestructive Testing and Computer Simulations in Science and Engineering : 8-12 June 1998, St. Petersburg, Russia.  pp.112-121,  1999.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3687
4.

Conference Proceedings
Conference Proceedings
4. Optical and magnetic properties for erbium-related centers in self-assembled silicon nanostructures
Bagraev,N.T. ; Bouravleuv,A.D. ; Gehlhoff,W. ; Klyachkin,L.E. ; Malyarenko,A.M. ; Mezdrogina,M.M. ; Naeser,A. ; Romanov,V.V. ; Rykov,S.A.
Pub. info.: Third International Workshop on Nondestructive Testing and Computer Simulations in Science and Engineering : 7-11 June 1999, St. Petersburg, Russia.  pp.129-134,  2000.  Bellingham, Wash., USA.  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4064
5.

Conference Proceedings
Conference Proceedings
5. The Nature of Trigonal Centers in Iron-Doped p-type Silicon
Gehlhoff,W. ; Irmscher,K. ; Rehse,U.
Pub. info.: Proceedings of the 17th International Conference on Defects in Semiconductors : ICDS-17, Gmunden, Austria, July 18-23, 1993.  Pt.2  pp.1233-1238,  1994.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 143-147
6.

Conference Proceedings
Conference Proceedings
6. Cadmium-related defects in silicon:electron-paramagnetic resonance identification
Gehlhoff,W. ; Naser,A. ; Lang,M. ; Pensl,G.
Pub. info.: Defects in semiconductors, icds-19 : proceedings of the 19th International Conference on Defects in Semiconductors, Aveiro, Portugal, July 1997.  Part1  pp.423-428,  1997.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 258-263
7.

Conference Proceedings
Conference Proceedings
7. Shallow and Deep Centers in Heavily Doped Silicon Quantum Wells
Gehlhoff,W. ; Bagraev,N.T. ; Klyacnkin,L.E.
Pub. info.: Proceedings of the 18th International Conference on Defects in Semiconductors : ICDS-18, Sendai, Japan, July 23-28, 1995.  pp.467-472,  1995.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 196-201
8.

Conference Proceedings
Conference Proceedings
8. An Electron Paramagnetic Resonance Study of Defects in Semiconducting Iron Disilicide
Irmscher,K. ; Gehlhoff,W. ; Tomm,Y. ; Lange,H.
Pub. info.: Proceedings of the 18th International Conference on Defects in Semiconductors : ICDS-18, Sendai, Japan, July 23-28, 1995.  pp.389-393,  1995.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 196-201
9.

Conference Proceedings
Conference Proceedings
9. Electronic Characterization of Defects in Iron-Doped p-Type Silicon
Gehlhoff,W. ; Irmscher,K. ; Rehse,U.
Pub. info.: Proceedings of the 15th International Conference on Defects in Semiconductors : Budapest, Hungary, August 22-26, 1988.  Part1  pp.373-378,  1989.  Aederlmannsdorf, Switzwelns.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 38-41