1.

Conference Proceedings

Conference Proceedings
Gebauer,J. ; Krause-Rehberg,R. ; Domke,C. ; Ebert,Ph. ; Urban,K.
Pub. info.: Defects in semiconductors, icds-19 : proceedings of the 19th International Conference on Defects in Semiconductors, Aveiro, Portugal, July 1997.  Part2  pp.885-892,  1997.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 258-263
2.

Conference Proceedings

Conference Proceedings
Eichler,S. ; Borner,F. ; Gebauer,J. ; Krause-Rehberg,R.
Pub. info.: Positron annihilation, ICPA-11 : Proceedings of the 11th International Conference on Positron Annihilation, Kansas City, Missouri, USA, May 1997.  pp.472-474,  1997.  Zuerich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 255-257
3.

Conference Proceedings

Conference Proceedings
Gebauer,J. ; Krause-Rehber,R. ; Domke,C. ; Ebert,Ph. ; Urban,K.
Pub. info.: Positron annihilation, ICPA-11 : Proceedings of the 11th International Conference on Positron Annihilation, Kansas City, Missouri, USA, May 1997.  pp.494-496,  1997.  Zuerich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 255-257
4.

Conference Proceedings

Conference Proceedings
Gebauer,J. ; Krause-Rehberg,R. ; Eichler,S. ; Bauer-Kugelmann,W. ; Kogel,G. ; Triftshauser,W. ; Luysberg,M. ; Sohn,H. ; Weber,E.R.
Pub. info.: Positron annihilation, ICPA-11 : Proceedings of the 11th International Conference on Positron Annihilation, Kansas City, Missouri, USA, May 1997.  pp.204-208,  1997.  Zuerich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 255-257
5.

Conference Proceedings

Conference Proceedings
Gebauer,J. ; Krause-Rehberg,R. ; Laustnann,M. ; Lippold,G.
Pub. info.: Defects in semiconductors, icds-19 : proceedings of the 19th International Conference on Defects in Semiconductors, Aveiro, Portugal, July 1997.  Part2  pp.905-910,  1997.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 258-263
6.

Conference Proceedings

Conference Proceedings
Specht,P. ; Jeong,S. ; Sohn,H. ; Luysberg,M. ; Prasad,A. ; Gebauer,J. ; Krausse-Rehberg,R. ; Weber,E.R.
Pub. info.: Defects in semiconductors, icds-19 : proceedings of the 19th International Conference on Defects in Semiconductors, Aveiro, Portugal, July 1997.  Part2  pp.951-956,  1997.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 258-263