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15 results

Conference Proceedings

1. High-precision 2D angle measurement using fringe analysis techniques

Ge,Z. ; Saito,T. ; Matsuda,S. ; Takeda,M.

Pub. info.:	Optical manufacturing and testing IV : 31 July-2 August 2001, San Diego, USA. pp.448-457, 2001. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	4451

Conference Proceedings

2. Self-reference method for phase-shift interferometry

Ge,Z. ; Takeda,M.

Pub. info.:	Optical engineering for sensing and nanotechnology (ICOSN 2001) : 6-8 June 2001, Yokohama, Japan. pp.152-157, 2001. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	4416

Conference Proceedings

3. Television automatic video-line tester

Ge,Z. ; Tang,D. ; Feng,B.

Pub. info.:	Automated optical inspection for industry: theory, technology, and applications II : 16-19 September, 1998, Beijing, China. pp.150-154, 1998. Bellingham, Washington. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	3558

Conference Proceedings

4. Optical and structural characteristics of lnGaAsIGaAs strained-layer superlattice

Li,M. ; Li,X. ; Song,X. ; Ge,Z. ; Zhang,X.

Pub. info.:	Current developments in optical elements and manufacturing : 16-18 September 1998, Beijing, China. pp.64-66, 1998. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	3557

Conference Proceedings

5. Determination of multiple analytes using a fiber optic biosensor based on fluorescence energy transfer

Thompson,R.B. ; Ge,Z. ; Patchan,M.W. ; Fierke,C.A. ; McCall,K.A. ; Elbaum,D. ; Christianson,D.W.

Pub. info.:	Proceedings of ultrasensitive biochemical diagnostics : 31 January, 2 February 1996, San Jose, California. pp.47-56, 1996. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	2680

Conference Proceedings

6. New scheme of high-precision visual collimator

Ge,Z. ; Han,Y. ; Chen,L.

Pub. info.:	Automated optical inspection for industry: theory, technology, and applications II : 16-19 September, 1998, Beijing, China. pp.146-149, 1998. Bellingham, Washington. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	3558

Conference Proceedings

7. Television image transmission from close quarters of a high-temperature object

Ge,Z. ; Su,J. ; Min,Q.

Pub. info.:	Automated optical inspection for industry : 6-7 November 1996, Beijing, China. pp.123-130, 1996. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	2899

Conference Proceedings

8. Photoelectric automatic three-dimensional straightness instrument

Ge,Z. ; Min,Q. ; Jiao,Z. ; Zeng,X.

Pub. info.:	Automated optical inspection for industry : 6-7 November 1996, Beijing, China. pp.131-140, 1996. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	2899

Conference Proceedings

9. Hierarchical structure of the logical Internet graph

Ge,Z. ; Figueiredo,D.R. ; Jaiswal,S. ; Gao,L.

Pub. info.:	Scalability and traffic control in IP networks : 22-24 August 2001, Denver, USA. pp.208-222, 2001. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	4526

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Conference Proceedings

10. Exploration for constructing superlarge-aperture plane wavefront (SLAPW)

Ge,Z. ; Li,X. ; Wang,C.

Pub. info.:	Advanced optical manufacturing and testing technology : 1-3 November 2000, Chengdu, China. pp.423-429, 2000. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	4231

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