Pair charge correlations in silicon nanostructures
- Author(s):
Bagraev,N.T. ( A.F.loffe Physical-Technical Institute ) Bouravleuv,A.D. Gasumyants,V.E. Gehihoff,W. Klyachkin,L.E. Malyarenko,A.M. Naeser,A.F.A. Romanov,V.V. Rykov,S.A. Vladimirskaya,E.V. - Publication title:
- International Workshop on Nondestructive Testing and Computer Simulations in Science and Engineering : 8-12 June 1998, St. Petersburg, Russia
- Title of ser.:
- Proceedings of SPIE - the International Society for Optical Engineering
- Ser. no.:
- 3687
- Pub. Year:
- 1999
- Page(from):
- 105
- Page(to):
- 111
- Pub. info.:
- Bellingham, Wash.: SPIE - The International Society for Optical Engineering
- ISSN:
- 0277786X
- ISBN:
- 9780819431615 [0819431613]
- Language:
- English
- Call no.:
- P63600/3687
- Type:
- Conference Proceedings
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