1.

Conference Proceedings
Conference Proceedings
1. Atmospheric correction for shortwave spectral imagery based on MODTRAN4
Adler-Golden,S.M. ; Matthew,M.W. ; Bernstein,L.S. ; Levine,R.Y. ; Berk,A. ; Richtsmeier,S.C. ; Acharya,P.K. ; Anderson,G.P. ; Felde,G. ; Gardner,J. ; Hoke,M.L. ; Jeong,L.S. ; Pukall,B. ; Ratkowski,A.J.
Pub. info.: Imaging spectrometry V : 19-21 July 1999, Denver, Colorado.  pp.61-69,  1999.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3753
2.

Conference Proceedings
Conference Proceedings
2. Ion Implantation Doping in SiC and its Device Applications
Rao,M.V. ; Gardner,J. ; Edwards,A. ; Papanicolaou,N.A. ; Kelner,G. ; Holland,O.W. ; Ghezzo,M. ; Kretchmer,J.
Pub. info.: Silicon carbide, III-nitrides and related materials, ICSCIII-N'97 : proceedings of the International Conference on Silicon Carbide, III-Nitrides and Related Materials, Stockholm, Sweden, September 1997.  Part2  pp.717-720,  1998.  Zuerich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 264-268
3.

Conference Proceedings
Conference Proceedings
3. Discrimination between cancers and benign breast lesions by ultrasound disparity mapping
Steinberg,B.D. ; Carlson,D.L. ; Zuckerman,J.A. ; Gardner,J.
Pub. info.: Medical Imaging 2000: Ultrasonic Imaging and Signal Processing.  pp.172-179,  2000.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3982
4.

Conference Proceedings
Conference Proceedings
4. Improvement of the theoretical minimum detectable angle of the optical beam deflection method
Garcia-Valenzuela,A. ; Gardner,J. ; Tabib-Azar,M.
Pub. info.: Integrated Optics and Microstructures III.  pp.146-156,  1996.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 2686