1.

Conference Proceedings
Conference Proceedings
1. 1/f noise and ballistic mobility in GaN/AlGaN heterostructure field effect transistors in high magnetic fields
Rumyantsev, S. L. ; Shur, M. S. ; Knap, W. ; Dyakonova, N. ; Pascal, F. ; Hoffman, A. ; Ghuel, Y. ; Gaquiere, C. ; Theron, D.
Pub. info.: Noise in devices and circuits II : 26-28 May 2004, Maspalomas, Gran Canaria, Spain.  pp.277-285,  2004.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5470
2.

Conference Proceedings
Conference Proceedings
2. LP-MOCVD Growth of GaAlN/GaN Heterostructures on Silicon Carbide: Application to HEMT's Devices
Di Forte Poisson, M-A. ; Magis, M. ; Tordjman, M. ; Aubry, R. ; Pesohang, M. ; Delage, S.L. ; Persio, J. Di ; Grimbert, B. ; Hoel, V. ; Delos, E. ; Ducatteau, D. ; Gaquiere, C.
Pub. info.: GaN and related alloys - 2003 : symposium held December 1-5, 2003, Boston, Massachusetts, U.S.A..  pp.107-112,  2004.  Warrendale, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 798
3.

Conference Proceedings
Conference Proceedings
3. Low-frequency drain noise in AlGaN/GaN HEMTs on Si substrate
Malbert, N. ; Labat, N. ; Curutchet, A. ; Touboul, A. ; Gaquiere, C. ; Minko, A.
Pub. info.: Noise in Devices and Circuits.  pp.342-349,  2003.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5113
4.

Conference Proceedings
Conference Proceedings
4. Improvement of conductivity and breakdown characteristics of AlGaN/GaN HEMT structures in passivation experiments
Shapoval, S. ; Gurtovoi, V. ; Kovalchuk, A. ; Eastman, L.F. ; Vertjachih, A. ; Gaquiere, C. ; Theron, D.
Pub. info.: 10th International Symposium on Nanostructures: Physics and Technology.  pp.90-93,  2003.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5023